Inventor
GUNDA ARUN
NL8 patents
⚠️ This page may combine multiple inventors who share the name “GUNDA ARUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
LSI LOGIC CORP
3 patentsUS5903578AMay 11, 1999
Test shells for protecting proprietary information in asic cores
LSI LOGIC CORP23 citations91
US7555688B2Jun 30, 2009
Method for implementing test generation for systematic scan reconfiguration in an integrated circuit
LSI LOGIC CORP24 citations86
US6212655B1Apr 3, 2001
IDDQ test solution for large asics
LSI LOGIC CORP7 citations67
LSI CORP
3 patentsUS7461307B2Dec 2, 2008
System and method for improving transition delay fault coverage in delay fault tests through use of an enhanced scan flip-flop
LSI CORP12 citations81
US7293210B2Nov 6, 2007
System and method for improving transition delay fault coverage in delay fault tests through use of transition launch flip-flop
LSI CORP8 citations71
US7461315B2Dec 2, 2008
Method and system for improving quality of a circuit through non-functional test pattern identification
LSI CORP2 citations60