Inventor
YASUE TAKAO
JP23 patents
Patents
23 patentsUS6249264B1Jun 19, 2001
Surface discharge type plasma display panel with intersecting barrier ribs
MITSUBISHI ELECTRIC CORP122 citations97
US5652428AJul 29, 1997
Method of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphere
MITSUBISHI ELECTRIC CORP65 citations96
US5550372AAug 27, 1996
Apparatus and method for analyzing foreign matter on semiconductor wafers and for controlling the manufacturing process of semiconductor devices
MITSUBISHI ELECTRIC CORP21 citations92
US5477732ADec 26, 1995
Adhesion measuring method
MITSUBISHI ELECTRIC CORP45 citations92
US5469733ANov 28, 1995
Cantilever for atomic force microscope and method of manufacturing the cantilever
MITSUBISHI ELECTRIC CORP31 citations92
US5107114AApr 21, 1992
Fine scanning mechanism for atomic force microscope
MITSUBISHI ELECTRIC CORP45 citations92
US5060043AOct 22, 1991
Semiconductor wafer with notches
MITSUBISHI ELECTRIC CORP29 citations92
US4947042AAug 7, 1990
Tunnel unit and scanning head for scanning tunneling microscope
MITSUBISHI ELECTRIC CORP39 citations92
US4945235AJul 31, 1990
Fine adjustment mechanism for a scanning tunneling microscope
MITSUBISHI ELECTRIC CORP30 citations92
US4880975ANov 14, 1989
Fine adjustment mechanism for a scanning tunneling microscope
MITSUBISHI ELECTRIC CORP48 citations92
US6683589B2Jan 27, 2004
Surface discharge type plasma display panel with intersecting barrier ribs
MITSUBISHI ELECTRIC CORP19 citations91
US5193385AMar 16, 1993
Cantilever for use in atomic force microscope and manufacturing method therefor
MITSUBISHI ELECTRIC CORP19 citations82
US4837445AJun 6, 1989
Coarse adjusting device of scanning tunneling microscope
MITSUBISHI ELECTRIC CORP19 citations82
US6417620B1Jul 9, 2002
Surface discharge plasma display panel having two-dimensional black stripes of specific size and shape
MITSUBISHI ELECTRIC CORP12 citations74
US5723982AMar 3, 1998
Apparatus for analyzing thin film property
MITSUBISHI ELECTRIC CORP15 citations74
US5147824ASep 15, 1992
Semiconductor wafer
MITSUBISHI ELECTRIC CORP5 citations74
US5040048AAug 13, 1991
Metal interconnection layer having reduced hillock formation
MITSUBISHI ELECTRIC CORP7 citations74
US6638129B2Oct 28, 2003
Surface discharge type plasma display panel with intersecting barrier ribs
MITSUBISHI ELECTRIC CORP5 citations72
US5530253AJun 25, 1996
Sample stage for scanning probe microscope head
MITSUBISHI ELECTRIC CORP6 citations63
US5236866AAug 17, 1993
Metal interconnection layer having reduced hillock formation in semi-conductor device and manufacturing method therefor
MITSUBISHI ELECTRIC CORP6 citations63
US5088290AFeb 18, 1992
Transfer vessel apparatus and method of storing samples
MITSUBISHI ELECTRIC CORP4 citations63
US5043148AAug 27, 1991
Transfer device
MITSUBISHI ELECTRIC CORP4 citations63
US4856297AAug 15, 1989
Transfer vessel device and method of transfer using the device
MITSUBISHI ELECTRIC CORP5 citations63