Inventor

TAKADA TAKU

JP2 patents

Patents

2 patents

US5225834AJul 6, 1993

Semiconductor integrated circuit boundary scan test with multiplexed node selection

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD26 citations90

US5404177AApr 4, 1995

Double-picture type television receiver

MATSUSHITA ELECTRIC INDUSTRIAL CO LTD10 citations70