Inventor
JUNG CHUL-MIN
KR19 patents
⚠️ This page may combine multiple inventors who share the name “JUNG CHUL-MIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
11 patentsUS6011421AJan 4, 2000
Scalable level shifter for use in semiconductor memory device
SAMSUNG ELECTRONICS CO LTD75 citations95
US5592121AJan 7, 1997
Internal power-supply voltage supplier of semiconductor integrated circuit
SAMSUNG ELECTRONICS CO LTD31 citations92
US5477497ADec 19, 1995
Semiconductor memory device
SAMSUNG ELECTRONICS CO LTD26 citations92
US6275069B1Aug 14, 2001
Self-resetting logic circuits and method of operation thereof
SAMSUNG ELECTRONICS CO LTD15 citations83
US6023177AFeb 8, 2000
Semiconductor memory device for providing burst mode control signal, device comprising plural serial transition registers
SAMSUNG ELECTRONICS CO LTD13 citations73
US5384736AJan 24, 1995
Data output circuit of a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD15 citations73
US6064609AMay 16, 2000
Semiconductor memory device with true/complement redundancy scheme
SAMSUNG ELECTRONICS CO LTD8 citations72
US5467313ANov 14, 1995
Level shifter and data output buffer having same
SAMSUNG ELECTRONICS CO LTD14 citations72
US5777931AJul 7, 1998
Synchronized redundancy decoding systems and methods for integrated circuit memory devices
SAMSUNG ELECTRONICS CO LTD15 citations71
US5699304ADec 16, 1997
Dynamic level converter of a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD7 citations71
US5680062AOct 21, 1997
Gunn transceiver logic input circuit for use in a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD6 citations63
MICRON TECHNOLOGY INC
6 patentsUS6944066B1Sep 13, 2005
Low voltage data path and current sense amplifier
MICRON TECHNOLOGY INC35 citations92
US7071770B2Jul 4, 2006
Low supply voltage bias circuit, semiconductor device, wafer and system including same, and method of generating a bias reference
MICRON TECHNOLOGY INC6 citations73
US7268614B2Sep 11, 2007
Low supply voltage bias circuit, semiconductor device, wafer and system including same, and method of generating a bias reference
MICRON TECHNOLOGY INC2 citations62
US6985391B2Jan 10, 2006
High speed redundant data sensing method and apparatus
MICRON TECHNOLOGY INC4 citations62
US7606088B2Oct 20, 2009
Sense amplifier circuit
MICRON TECHNOLOGY INC0 citations51
US7274609B2Sep 25, 2007
High speed redundant data sensing method and apparatus
MICRON TECHNOLOGY INC1 citations51