Inventor
SCHETTLER HELMUT
23 patents
Patents
23 patentsUS5244833ASep 14, 1993
Method for manufacturing an integrated circuit chip bump electrode using a polymer layer and a photoresist layer
IBM155 citations96
US6537861B1Mar 25, 2003
SOI transistor with body contact and method of forming same
IBM95 citations95
US5016087AMay 14, 1991
Integrated circuit package
IBM62 citations94
US4890238ADec 26, 1989
Method for physical VLSI-chip design
IBM94 citations94
US5010389AApr 23, 1991
Integrated circuit substrate with contacts thereon for a packaging structure
IBM55 citations93
US4353040AOct 5, 1982
Multi-layer module with constant characteristic impedance
IBM61 citations92
US5162264ANov 10, 1992
Integrated circuit package
IBM24 citations91
US4815113AMar 21, 1989
Method for digital slope control of output signals of power amplifiers in semiconductor chips
IBM30 citations91
US5744996AApr 28, 1998
CMOS integrated semiconductor circuit
IBM48 citations89
US4551789ANov 5, 1985
Multilayer ceramic substrates with several metallization planes
IBM32 citations86
US5306866AApr 26, 1994
Module for electronic package
IBM19 citations77
US4490673ADec 25, 1984
Testing an integrated circuit containing a tristate driver and a control signal generating network therefor
IBM12 citations74
US6812560B2Nov 2, 2004
Press-fit chip package
IBM10 citations71
US4287437ASep 1, 1981
Method and circuitry for equalizing the differing delays of semiconductor chips
IBM8 citations71
US4845676AJul 4, 1989
Non-clocked static memory cell
IBM9 citations68
US4682050AJul 21, 1987
Small signal swing driver circuit
IBM13 citations68
US4092551AMay 30, 1978
A.C. powered speed up circuit
IBM17 citations67
US4967104AOct 30, 1990
Circuit for increasing the output impedance of an amplifier
IBM2 citations61
US4668879AMay 26, 1987
Dotted "or" function for current controlled gates
IBM6 citations57
US4437022AMar 13, 1984
Monolithically integrated push-pull driver
IBM3 citations56
US7990158B2Aug 2, 2011
Measurement arrangement for determining the characteristic line parameters by measuring scattering parameters
IBM1 citations52
US7194399B2Mar 20, 2007
Automatic check for cyclic operating conditions for SOI circuit simulation
IBM1 citations49
US4656367AApr 7, 1987
Speed up of up-going transition of TTL or DTL circuits under high _capacitive load
IBM0 citations38