Inventor
SAGAWA RYUSUKE
JP14 patents
⚠️ This page may combine multiple inventors who share the name “SAGAWA RYUSUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JEOL LTD
6 patentsUS10361061B2Jul 23, 2019
Electron microscope and image acquisition method
JEOL LTD2 citations71
US11842880B2Dec 12, 2023
Estimation model generation method and electron microscope
JEOL LTD0 citations56
US11764029B2Sep 19, 2023
Method of measuring aberration and electron microscope
JEOL LTD0 citations56
US12255041B2Mar 18, 2025
Electron microscope and method of correcting aberration
JEOL LTD0 citations53
US11545337B2Jan 3, 2023
Scanning transmission electron microscope and adjustment method of optical system
JEOL LTD0 citations50
US10340118B2Jul 2, 2019
Scanning transmission electron microscope and method of image generation
JEOL LTD0 citations39