P

Inventor

IKEUCHI NAOKI

JP13 patents
⚠️ This page may combine multiple inventors who share the name “IKEUCHI NAOKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TOKYO ELECTRON LTD

8 patents
US6931928B2Aug 23, 2005

Microstructure with movable mass

TOKYO ELECTRON LTD18 citations90
US7428841B2Sep 30, 2008

Acceleration sensor and inclination-detecting method

TOKYO ELECTRON LTD10 citations84
US7348788B2Mar 25, 2008

Probing card and inspection apparatus for microstructure

TOKYO ELECTRON LTD7 citations73
US7019540B2Mar 28, 2006

Electrostatic capacitance detection circuit and microphone device

TOKYO ELECTRON LTD8 citations73
US7005865B2Feb 28, 2006

Circuit and method for impedance detection

TOKYO ELECTRON LTD8 citations73
US7726190B2Jun 1, 2010

Device, method and program for inspecting microstructure

TOKYO ELECTRON LTD7 citations71
US7034551B2Apr 25, 2006

Electrostatic capacitance detection circuit and microphone device

TOKYO ELECTRON LTD2 citations62
US7023223B2Apr 4, 2006

Impedance measuring circuit and capacitance measuring circuit

TOKYO ELECTRON LTD2 citations62

SUMITOMO METAL IND

2 patents
US6223601B1May 1, 2001

Vibration wave detecting method and vibration wave detector

SUMITOMO METAL IND39 citations92
US6438243B1Aug 20, 2002

Vibration wave detector

SUMITOMO METAL IND38 citations90

OCTEC INC

1 patent
US7383732B2Jun 10, 2008

Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structure

OCTEC INC11 citations83

IKEUCHI NAOKI

1 patent
US8141426B2Mar 27, 2012

Displacement measurement apparatus for microstructure and displcement measurement method thereof

IKEUCHI NAOKI10 citations79

MIYANO TAKAYA

1 patent
US8082124B2Dec 20, 2011

Method and system for diagnosing abnormal plasma discharge

MIYANO TAKAYA5 citations57