Inventor
LUNDQUIST THEODORE R
US19 patents
⚠️ This page may combine multiple inventors who share the name “LUNDQUIST THEODORE R”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
DCG SYSTEMS INC
8 patentsUS7786436B1Aug 31, 2010
FIB based open via analysis and repair
DCG SYSTEMS INC78 citations95
US7842920B2Nov 30, 2010
Methods and systems of performing device failure analysis, electrical characterization and physical characterization
DCG SYSTEMS INC18 citations84
US7883630B2Feb 8, 2011
FIB milling of copper over organic dielectrics
DCG SYSTEMS INC7 citations82
US7530034B2May 5, 2009
Apparatus and method for circuit operation definition
DCG SYSTEMS INC10 citations80
US7409653B2Aug 5, 2008
Sub-resolution alignment of images
DCG SYSTEMS INC9 citations79
US7439168B2Oct 21, 2008
Apparatus and method of forming silicide in a localized manner
DCG SYSTEMS INC7 citations64
US7884024B2Feb 8, 2011
Apparatus and method for optical interference fringe based integrated circuit processing
DCG SYSTEMS INC4 citations58
US7697146B2Apr 13, 2010
Apparatus and method for optical interference fringe based integrated circuit processing
DCG SYSTEMS INC0 citations51
CREDENCE SYSTEMS CORP
8 patentsUS7135678B2Nov 14, 2006
Charged particle guide
CREDENCE SYSTEMS CORP52 citations91
US7060196B2Jun 13, 2006
FIB milling of copper over organic dielectrics
CREDENCE SYSTEMS CORP20 citations91
US6943572B2Sep 13, 2005
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP15 citations90
US7400154B2Jul 15, 2008
Apparatus and method for detecting photon emissions from transistors
CREDENCE SYSTEMS CORP10 citations82
US6848087B2Jan 25, 2005
Sub-resolution alignment of images
CREDENCE SYSTEMS CORP13 citations80
US7115426B2Oct 3, 2006
Method and apparatus for addressing thickness variations of a trench floor formed in a semiconductor substrate
CREDENCE SYSTEMS CORP9 citations72
US6905623B2Jun 14, 2005
Precise, in-situ endpoint detection for charged particle beam processing
CREDENCE SYSTEMS CORP3 citations62
US7036109B1Apr 25, 2006
Imaging integrated circuits with focused ion beam
CREDENCE SYSTEMS CORP2 citations60