Inventor
CHU MIN SIK
KR6 patents
Patents
6 patentsUS11587222B2Feb 21, 2023
Method and apparatus for detecting defect pattern on wafer based on unsupervised learning
SAMSUNG SDS CO LTD4 citations68
US12013918B2Jun 18, 2024
Method and apparatus for clustering images
SAMSUNG SDS CO LTD0 citations56
US11823926B2Nov 21, 2023
Process management method and apparatus
SAMSUNG SDS CO LTD0 citations56
US11816579B2Nov 14, 2023
Method and apparatus for detecting defect pattern on wafer based on unsupervised learning
SAMSUNG SDS CO LTD0 citations56
US11222798B2Jan 11, 2022
Process management method and apparatus
SAMSUNG SDS CO LTD0 citations56
US10861048B2Dec 8, 2020
Content scheduling method and apparatus
SAMSUNG SDS CO LTD0 citations36