Inventor
JOO JAE-HOON
KR21 patents
⚠️ This page may combine multiple inventors who share the name “JOO JAE-HOON”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
15 patentsUS5929696AJul 27, 1999
Circuit for converting internal voltage of semiconductor device
SAMSUNG ELECTRONICS CO LTD43 citations92
US6111457AAug 29, 2000
Internal power supply circuit for use in a semiconductor device
SAMSUNG ELECTRONICS CO LTD26 citations90
US6490222B2Dec 3, 2002
Decoding circuit for controlling activation of wordlines in a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD15 citations84
US7460428B2Dec 2, 2008
Dynamic random access memory and communications terminal including the same
SAMSUNG ELECTRONICS CO LTD11 citations81
US6438042B1Aug 20, 2002
Arrangement of bitline boosting capacitor in semiconductor memory device
SAMSUNG ELECTRONICS CO LTD7 citations74
US6215723B1Apr 10, 2001
Semiconductor memory device having sequentially disabling activated word lines
SAMSUNG ELECTRONICS CO LTD9 citations74
US6225818B1May 1, 2001
Integrated circuits including function identification circuits having operating modes that identify corresponding functions of the integrated circuits
SAMSUNG ELECTRONICS CO LTD10 citations73
US5949724ASep 7, 1999
Burn-in stress circuit for semiconductor memory device
SAMSUNG ELECTRONICS CO LTD11 citations69
US6345011B2Feb 5, 2002
Input/output line structure of a semiconductor memory device
SAMSUNG ELECTRONICS CO LTD6 citations63
US6396756B1May 28, 2002
Integrated circuit memory devices including transmission parts that are adjacent input/output selection parts
SAMSUNG ELECTRONICS CO LTD2 citations60
US7476983B2Jan 13, 2009
Semiconductor device including wire bonding pads and pad layout method
SAMSUNG ELECTRONICS CO LTD2 citations59
US6909654B2Jun 21, 2005
Bit line pre-charge circuit of semiconductor memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US6522597B2Feb 18, 2003
Semiconductor memory device and bit line isolation gate arrangement method thereof
SAMSUNG ELECTRONICS CO LTD1 citations52
US6473325B2Oct 29, 2002
Bit line sensing control circuit for a semiconductor memory device and layout of the same
SAMSUNG ELECTRONICS CO LTD0 citations51
US10295564B2May 21, 2019
Apparatus for clamping a probe card and probe card including the same
SAMSUNG ELECTRONICS CO LTD0 citations48
KOREA ZINC CO LTD
2 patentsYC CORP
2 patentsUS12469579B2Nov 11, 2025
Semiconductor test apparatus capable of inducing reduction of power consumption
YC CORP0 citations51
US12461142B2Nov 4, 2025
Semiconductor wafer test system for controlling supply of power to semiconductor wafer test apparatus and method of controlling supply of power to semiconductor wafer test apparatus
YC CORP0 citations50