Inventor
MALENDEVICH ROMAN
US9 patents
Patents
9 patentsUS7378861B1May 27, 2008
Optical alignment loops for the wafer-level testing of optical and optoelectronic chips
LUXTERA INC72 citations97
US7024066B1Apr 4, 2006
Littrow gratings as alignment structures for the wafer level testing of optical and optoelectronic chips
LUXTERA INC91 citations97
US7586608B1Sep 8, 2009
Wafer-level testing of optical and optoelectronic chips
LUXTERA INC35 citations96
US7224174B1May 29, 2007
Optical alignment loops for the wafer-level testing of optical and optoelectronic chips
LUXTERA INC52 citations96
US7183759B1Feb 27, 2007
Optical probes with spacing sensors for the wafer level testing of optical and optoelectronic chips
LUXTERA INC54 citations96
US7184626B1Feb 27, 2007
Wafer-level testing of optical and optoelectronic chips
LUXTERA INC34 citations96
US7412138B1Aug 12, 2008
Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chips
LUXTERA INC17 citations92
US7262852B1Aug 28, 2007
Wafer-level testing of optical and optoelectronic chips
LUXTERA INC21 citations92
US7298939B1Nov 20, 2007
Optoelectronic alignment structures for the wafer level testing of optical and optoelectronic chips
LUXTERA INC8 citations73