Inventor
OUCHI YOSHIAKI
JP17 patents
⚠️ This page may combine multiple inventors who share the name “OUCHI YOSHIAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOSHIBA KK
13 patentsUS4760370AJul 26, 1988
Resistor and an electron tube incorporating the same
TOSHIBA KK10 citations74
US4963893AOct 16, 1990
Heat-resistant insulating substrate, thermal printing head, and thermographic apparatus
TOSHIBA KK4 citations73
US6447355B1Sep 10, 2002
Impregnated-type cathode substrate with large particle diameter low porosity region and small particle diameter high porosity region
TOSHIBA KK7 citations72
US6034469AMar 7, 2000
Impregnated type cathode assembly, cathode substrate for use in the assembly, electron gun using the assembly, and electron tube using the cathode assembly
TOSHIBA KK10 citations72
US5157107AOct 20, 1992
Heat-resistant insulating coating material and thermal head making use thereof
TOSHIBA KK8 citations70
US4906893AMar 6, 1990
X-ray image intensifier and method of manufacturing the same
TOSHIBA KK8 citations70
US4868584ASep 19, 1989
Heat-resistant polyimide insulative coated thermal head
TOSHIBA KK18 citations70
US4923763AMay 8, 1990
Perpendicular magnetic recording medium
TOSHIBA KK2 citations63
US5177498AJan 5, 1993
Heat-resistant insulating substrate, thermal printing head, and thermographic apparatus
TOSHIBA KK2 citations62
US5119112AJun 2, 1992
Heat-resistant insulating substrate, thermal printing head, and thermographic apparatus
TOSHIBA KK2 citations62
US6304024B1Oct 16, 2001
Impregnated-type cathode substrate with large particle diameter low porosity region and small particle diameter high porosity region
TOSHIBA KK4 citations61
US4835548AMay 30, 1989
Thermal head
TOSHIBA KK5 citations57
US4928034AMay 22, 1990
Impregnated cathode
TOSHIBA KK1 citations48
HITACHI LTD
4 patentsUS4562555ADec 31, 1985
Semiconductor memory device
HITACHI LTD59 citations96
US5150325ASep 22, 1992
Bi-CMOS semiconductor memory device, including improved layout structure and testing method
HITACHI LTD45 citations95
US5276648AJan 4, 1994
Testing method for a semiconductor memory device
HITACHI LTD21 citations92
US5506804AApr 9, 1996
Dynamic Random Access Type Semiconductor Device
HITACHI LTD9 citations73