Inventor
GIESSMANN SEBASTIAN
DE15 patents
⚠️ This page may combine multiple inventors who share the name “GIESSMANN SEBASTIAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MPI CORP
9 patentsUS12196779B2Jan 14, 2025
Probe system and machine apparatus thereof
MPI CORP0 citations59
US11703541B2Jul 18, 2023
Semiconductor inspecting method for ensuring scrubbing length on pad
MPI CORP0 citations59
US11693050B2Jul 4, 2023
Semiconductor inspecting method
MPI CORP0 citations59
US12092658B2Sep 17, 2024
Optical detection system and alignment method for a predetermined target object
MPI CORP0 citations55
US12196808B2Jan 14, 2025
Motorized chuck stage controlling method
MPI CORP0 citations49
US10895587B2Jan 19, 2021
Wafer probe station
MPI CORP0 citations46
US10996239B1May 4, 2021
Method of positioning probe tips relative to pads
MPI CORP0 citations45
US11313883B2Apr 26, 2022
Probe station capable of maintaining position of probe tip upon temperature change
MPI CORP0 citations44
US12007319B2Jun 11, 2024
Optical path correction subassembly, optical detection assembly, and optical detection system
MPI CORP0 citations43