Inventor
AN JANGHYUK
KR4 patents
Patents
4 patentsUS9658949B2May 23, 2017
Test system of system on chip and test method thereof
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Electronic device for managing degree of degradation
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US11181571B2Nov 23, 2021
Electronic device for managing degree of degradation
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US12411760B2Sep 9, 2025
Memory device and method with compute express link for degradation
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