Inventor
FISTER WALLACE E
US14 patents
Patents
14 patentsUS5935263AAug 10, 1999
Method and apparatus for memory array compressed data testing
MICRON TECHNOLOGY INC503 citations98
US6452868B1Sep 17, 2002
Method for generating memory addresses for accessing memory-cell arrays in memory devices
MICRON TECHNOLOGY INC78 citations96
US6324657B1Nov 27, 2001
On-clip testing circuit and method for improving testing of integrated circuits
MICRON TECHNOLOGY INC56 citations96
US6327199B1Dec 4, 2001
Method for testing memory devices
MICRON TECHNOLOGY INC24 citations92
US6049505AApr 11, 2000
Method and apparatus for generating memory addresses for testing memory devices
MICRON TECHNOLOGY INC23 citations92
US8687435B2Apr 1, 2014
System and method for reducing pin-count of memory devices, and memory device testers for same
MICRON TECHNOLOGY INC9 citations83
US6839292B2Jan 4, 2005
Apparatus and method for parallel programming of antifuses
MICRON TECHNOLOGY INC16 citations83
US6538938B2Mar 25, 2003
Method for generating memory addresses for accessing memory-cell arrays in memory devices
MICRON TECHNOLOGY INC5 citations73
US6483773B1Nov 19, 2002
Method for generating memory addresses for testing memory devices
MICRON TECHNOLOGY INC5 citations73
US6115303ASep 5, 2000
Method and apparatus for testing memory devices
MICRON TECHNOLOGY INC4 citations73
US6510102B2Jan 21, 2003
Method for generating memory addresses for accessing memory-cell arrays in memory devices
MICRON TECHNOLOGY INC2 citations62
US6285609B1Sep 4, 2001
Method and apparatus for testing memory devices
MICRON TECHNOLOGY INC2 citations62
US6252811B1Jun 26, 2001
Method and apparatus for testing memory devices
MICRON TECHNOLOGY INC0 citations51
US6104669AAug 15, 2000
Method and apparatus for generating memory addresses for testing memory devices
MICRON TECHNOLOGY INC0 citations51