Inventor

STEPHAN JOHN E

US2 patents

⚠️ This page may combine multiple inventors who share the name “STEPHAN JOHN E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CHAPMAN INSTR

1 patent

US6157450ADec 5, 2000

Automated optical surface profile measurement system

CHAPMAN INSTR52 citations86

CHAPMAN INSTR INC

1 patent

US7283256B2Oct 16, 2007

Method and apparatus for measuring wafer thickness

CHAPMAN INSTR INC7 citations62