Inventor
YING HUAJUN
US5 patents
Patents
5 patentsUS11580375B2Feb 14, 2023
Accelerated training of a machine learning based model for semiconductor applications
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US10607119B2Mar 31, 2020
Unified neural network for defect detection and classification
KLA TENCOR CORP8 citations83
US10482590B2Nov 19, 2019
Method and system for defect classification
KLA TENCOR CORP11 citations80
US10436720B2Oct 8, 2019
Adaptive automatic defect classification
KLA TENCOR CORP8 citations76
US9898811B2Feb 20, 2018
Method and system for defect classification
KLA TENCOR CORP4 citations71