Inventor
CHANG CHUNG-LONG
TW60 patents
⚠️ This page may combine multiple inventors who share the name “CHANG CHUNG-LONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
38 patentsUS6010962AJan 4, 2000
Copper chemical-mechanical-polishing (CMP) dishing
TAIWAN SEMICONDUCTOR MFG339 citations99
US6136680AOct 24, 2000
Methods to improve copper-fluorinated silica glass interconnects
TAIWAN SEMICONDUCTOR MFG133 citations97
US6049137AApr 11, 2000
Readable alignment mark structure formed using enhanced chemical mechanical polishing
TAIWAN SEMICONDUCTOR MFG47 citations96
US5786260AJul 28, 1998
Method of fabricating a readable alignment mark structure using enhanced chemical mechanical polishing
TAIWAN SEMICONDUCTOR MFG80 citations96
US6559040B1May 6, 2003
Process for polishing the top surface of a polysilicon gate
TAIWAN SEMICONDUCTOR MFG28 citations93
US6410424B1Jun 25, 2002
Process flow to optimize profile of ultra small size photo resist free contact
TAIWAN SEMICONDUCTOR MFG26 citations93
US6200875B1Mar 13, 2001
Chemical mechanical polishing of polysilicon plug using a silicon nitride stop layer
TAIWAN SEMICONDUCTOR MFG17 citations93
US6153512ANov 28, 2000
Process to improve adhesion of HSQ to underlying materials
TAIWAN SEMICONDUCTOR MFG47 citations93
US7050290B2May 23, 2006
Integrated capacitor
TAIWAN SEMICONDUCTOR MFG21 citations92
US6949781B2Sep 27, 2005
Metal-over-metal devices and the method for manufacturing same
TAIWAN SEMICONDUCTOR MFG26 citations92
US6613623B1Sep 2, 2003
High fMAX deep submicron MOSFET
TAIWAN SEMICONDUCTOR MFG18 citations92
US6465294B1Oct 15, 2002
Self-aligned process for a stacked gate RF MOSFET device
TAIWAN SEMICONDUCTOR MFG31 citations92
US6391792B1May 21, 2002
Multi-step chemical mechanical polish (CMP) planarizing method for forming patterned planarized aperture fill layer
TAIWAN SEMICONDUCTOR MFG22 citations92
US5933744AAug 3, 1999
Alignment method for used in chemical mechanical polishing process
TAIWAN SEMICONDUCTOR MFG53 citations92
US5709755AJan 20, 1998
Method for CMP cleaning improvement
TAIWAN SEMICONDUCTOR MFG27 citations92
US6888063B1May 3, 2005
Device and method for providing shielding in radio frequency integrated circuits to reduce noise coupling
TAIWAN SEMICONDUCTOR MFG42 citations91
US7760144B2Jul 20, 2010
Antennas integrated in semiconductor chips
TAIWAN SEMICONDUCTOR MFG17 citations84
US7545022B2Jun 9, 2009
Capacitor pairs with improved mismatch performance
TAIWAN SEMICONDUCTOR MFG11 citations84
US6350693B2Feb 26, 2002
Method of CMP of polysilicon
TAIWAN SEMICONDUCTOR MFG14 citations84
US6271123B1Aug 7, 2001
Chemical-mechanical polish method using an undoped silicon glass stop layer for polishing BPSG
TAIWAN SEMICONDUCTOR MFG16 citations84
US6268281B1Jul 31, 2001
Method to form self-aligned contacts with polysilicon plugs
TAIWAN SEMICONDUCTOR MFG18 citations84
US6242356B1Jun 5, 2001
Etchback method for forming microelectronic layer with enhanced surface smoothness
TAIWAN SEMICONDUCTOR MFG17 citations84
US8053865B2Nov 8, 2011
MOM capacitors integrated with air-gaps
TAIWAN SEMICONDUCTOR MFG10 citations83
US8022458B2Sep 20, 2011
Capacitors integrated with metal gate formation
TAIWAN SEMICONDUCTOR MFG12 citations83
US7335956B2Feb 26, 2008
Capacitor device with vertically arranged capacitor regions of various kinds
TAIWAN SEMICONDUCTOR MFG18 citations82
US5972798AOct 26, 1999
Prevention of die loss to chemical mechanical polishing
TAIWAN SEMICONDUCTOR MFG16 citations82
US7923817B2Apr 12, 2011
Capacitor pairs with improved mismatch performance
TAIWAN SEMICONDUCTOR MFG5 citations74
US7035083B2Apr 25, 2006
Interdigitated capacitor and method for fabrication thereof
TAIWAN SEMICONDUCTOR MFG10 citations74
US6737310B2May 18, 2004
Self-aligned process for a stacked gate RF MOSFET device
TAIWAN SEMICONDUCTOR MFG11 citations74
US6207483B1Mar 27, 2001
Method for smoothing polysilicon gate structures in CMOS devices
TAIWAN SEMICONDUCTOR MFG12 citations74
US6191039B1Feb 20, 2001
Method of CMP of polysilicon
TAIWAN SEMICONDUCTOR MFG8 citations74
US5773360AJun 30, 1998
Reduction of surface contamination in post-CMP cleaning
TAIWAN SEMICONDUCTOR MFG14 citations74
US6176141B1Jan 23, 2001
Method for stud pull test for film formed on semiconductor device
TAIWAN SEMICONDUCTOR MFG12 citations70
US7612984B2Nov 3, 2009
Layout for capacitor pair with high capacitance matching
TAIWAN SEMICONDUCTOR MFG2 citations63
US7061056B2Jun 13, 2006
High fMAX deep submicron MOSFET
TAIWAN SEMICONDUCTOR MFG4 citations63
US6524906B2Feb 25, 2003
Chemical mechanical polishing of polysilicon plug using a silicon nitride stop layer
TAIWAN SEMICONDUCTOR MFG2 citations63
US6746966B1Jun 8, 2004
Method to solve alignment mark blinded issues and a technology for application of semiconductor etching at a tiny area
TAIWAN SEMICONDUCTOR MFG4 citations62
US7338909B2Mar 4, 2008
Micro-etching method to replicate alignment marks for semiconductor wafer photolithography
TAIWAN SEMICONDUCTOR MFG5 citations58
TAIWAN SEMICONDUCTOR MFG CO LTD
8 patentsUS9269591B2Feb 23, 2016
Handle wafer for high resistivity trap-rich SOI
TAIWAN SEMICONDUCTOR MFG CO LTD10 citations83
US10475877B1Nov 12, 2019
Multi-terminal inductor for integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD6 citations82
US10269701B2Apr 23, 2019
Semiconductor structure with ultra thick metal and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10672860B2Jun 2, 2020
Multi-terminal inductor for integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations71
US10515949B2Dec 24, 2019
Integrated circuit and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations70
US11670584B2Jun 6, 2023
Semiconductor structure with ultra thick metal and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11114378B2Sep 7, 2021
Semiconductor structure with ultra thick metal and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11264378B2Mar 1, 2022
Integrated circuit
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations60
CHANG CHUNG-LONG
3 patentsUS8330251B2Dec 11, 2012
Semiconductor device structure for reducing mismatch effects
CHANG CHUNG-LONG11 citations83
US8237209B2Aug 7, 2012
Capacitors integrated with metal gate formation
CHANG CHUNG-LONG6 citations82
US8765600B2Jul 1, 2014
Contact structure for reducing gate resistance and method of making the same
CHANG CHUNG-LONG10 citations80
CHEN YUEH-YOU
1 patentShowing the top 50 of 60 patents by PatentIndex Score.