P

Inventor

CHANG CHUNG-LONG

TW60 patents
⚠️ This page may combine multiple inventors who share the name “CHANG CHUNG-LONG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG

38 patents
US6010962AJan 4, 2000

Copper chemical-mechanical-polishing (CMP) dishing

TAIWAN SEMICONDUCTOR MFG339 citations99
US6136680AOct 24, 2000

Methods to improve copper-fluorinated silica glass interconnects

TAIWAN SEMICONDUCTOR MFG133 citations97
US6049137AApr 11, 2000

Readable alignment mark structure formed using enhanced chemical mechanical polishing

TAIWAN SEMICONDUCTOR MFG47 citations96
US5786260AJul 28, 1998

Method of fabricating a readable alignment mark structure using enhanced chemical mechanical polishing

TAIWAN SEMICONDUCTOR MFG80 citations96
US6559040B1May 6, 2003

Process for polishing the top surface of a polysilicon gate

TAIWAN SEMICONDUCTOR MFG28 citations93
US6410424B1Jun 25, 2002

Process flow to optimize profile of ultra small size photo resist free contact

TAIWAN SEMICONDUCTOR MFG26 citations93
US6200875B1Mar 13, 2001

Chemical mechanical polishing of polysilicon plug using a silicon nitride stop layer

TAIWAN SEMICONDUCTOR MFG17 citations93
US6153512ANov 28, 2000

Process to improve adhesion of HSQ to underlying materials

TAIWAN SEMICONDUCTOR MFG47 citations93
US7050290B2May 23, 2006

Integrated capacitor

TAIWAN SEMICONDUCTOR MFG21 citations92
US6949781B2Sep 27, 2005

Metal-over-metal devices and the method for manufacturing same

TAIWAN SEMICONDUCTOR MFG26 citations92
US6613623B1Sep 2, 2003

High fMAX deep submicron MOSFET

TAIWAN SEMICONDUCTOR MFG18 citations92
US6465294B1Oct 15, 2002

Self-aligned process for a stacked gate RF MOSFET device

TAIWAN SEMICONDUCTOR MFG31 citations92
US6391792B1May 21, 2002

Multi-step chemical mechanical polish (CMP) planarizing method for forming patterned planarized aperture fill layer

TAIWAN SEMICONDUCTOR MFG22 citations92
US5933744AAug 3, 1999

Alignment method for used in chemical mechanical polishing process

TAIWAN SEMICONDUCTOR MFG53 citations92
US5709755AJan 20, 1998

Method for CMP cleaning improvement

TAIWAN SEMICONDUCTOR MFG27 citations92
US6888063B1May 3, 2005

Device and method for providing shielding in radio frequency integrated circuits to reduce noise coupling

TAIWAN SEMICONDUCTOR MFG42 citations91
US7760144B2Jul 20, 2010

Antennas integrated in semiconductor chips

TAIWAN SEMICONDUCTOR MFG17 citations84
US7545022B2Jun 9, 2009

Capacitor pairs with improved mismatch performance

TAIWAN SEMICONDUCTOR MFG11 citations84
US6350693B2Feb 26, 2002

Method of CMP of polysilicon

TAIWAN SEMICONDUCTOR MFG14 citations84
US6271123B1Aug 7, 2001

Chemical-mechanical polish method using an undoped silicon glass stop layer for polishing BPSG

TAIWAN SEMICONDUCTOR MFG16 citations84
US6268281B1Jul 31, 2001

Method to form self-aligned contacts with polysilicon plugs

TAIWAN SEMICONDUCTOR MFG18 citations84
US6242356B1Jun 5, 2001

Etchback method for forming microelectronic layer with enhanced surface smoothness

TAIWAN SEMICONDUCTOR MFG17 citations84
US8053865B2Nov 8, 2011

MOM capacitors integrated with air-gaps

TAIWAN SEMICONDUCTOR MFG10 citations83
US8022458B2Sep 20, 2011

Capacitors integrated with metal gate formation

TAIWAN SEMICONDUCTOR MFG12 citations83
US7335956B2Feb 26, 2008

Capacitor device with vertically arranged capacitor regions of various kinds

TAIWAN SEMICONDUCTOR MFG18 citations82
US5972798AOct 26, 1999

Prevention of die loss to chemical mechanical polishing

TAIWAN SEMICONDUCTOR MFG16 citations82
US7923817B2Apr 12, 2011

Capacitor pairs with improved mismatch performance

TAIWAN SEMICONDUCTOR MFG5 citations74
US7035083B2Apr 25, 2006

Interdigitated capacitor and method for fabrication thereof

TAIWAN SEMICONDUCTOR MFG10 citations74
US6737310B2May 18, 2004

Self-aligned process for a stacked gate RF MOSFET device

TAIWAN SEMICONDUCTOR MFG11 citations74
US6207483B1Mar 27, 2001

Method for smoothing polysilicon gate structures in CMOS devices

TAIWAN SEMICONDUCTOR MFG12 citations74
US6191039B1Feb 20, 2001

Method of CMP of polysilicon

TAIWAN SEMICONDUCTOR MFG8 citations74
US5773360AJun 30, 1998

Reduction of surface contamination in post-CMP cleaning

TAIWAN SEMICONDUCTOR MFG14 citations74
US6176141B1Jan 23, 2001

Method for stud pull test for film formed on semiconductor device

TAIWAN SEMICONDUCTOR MFG12 citations70
US7612984B2Nov 3, 2009

Layout for capacitor pair with high capacitance matching

TAIWAN SEMICONDUCTOR MFG2 citations63
US7061056B2Jun 13, 2006

High fMAX deep submicron MOSFET

TAIWAN SEMICONDUCTOR MFG4 citations63
US6524906B2Feb 25, 2003

Chemical mechanical polishing of polysilicon plug using a silicon nitride stop layer

TAIWAN SEMICONDUCTOR MFG2 citations63
US6746966B1Jun 8, 2004

Method to solve alignment mark blinded issues and a technology for application of semiconductor etching at a tiny area

TAIWAN SEMICONDUCTOR MFG4 citations62
US7338909B2Mar 4, 2008

Micro-etching method to replicate alignment marks for semiconductor wafer photolithography

TAIWAN SEMICONDUCTOR MFG5 citations58

TAIWAN SEMICONDUCTOR MFG CO LTD

8 patents

CHANG CHUNG-LONG

3 patents

CHEN YUEH-YOU

1 patent

Showing the top 50 of 60 patents by PatentIndex Score.