Inventor
XU ZHIWEI
85 patents
⚠️ This page may combine multiple inventors who share the name “XU ZHIWEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BEME INT LLC
13 patentsUSD433620SNov 14, 2000
Finial
BEME INT LLC8 citations74
USD432399SOct 24, 2000
Finial
BEME INT LLC9 citations74
USD430481SSep 5, 2000
Finial
BEME INT LLC7 citations72
USD434973SDec 12, 2000
Finial
BEME INT LLC3 citations63
USD433925SNov 21, 2000
Finial
BEME INT LLC3 citations63
USD432005SOct 17, 2000
Finial
BEME INT LLC4 citations63
USD437963SFeb 20, 2001
Lantern
BEME INT LLC2 citations62
USD434643SDec 5, 2000
Finial
BEME INT LLC4 citations61
USD433317SNov 7, 2000
Finial
BEME INT LLC3 citations61
USD431452SOct 3, 2000
Finial
BEME INT LLC3 citations61
USD430004SAug 29, 2000
Finial
BEME INT LLC3 citations61
USD430002SAug 29, 2000
Finial
BEME INT LLC3 citations61
USD430003SAug 29, 2000
Finial
BEME INT LLC4 citations61
KLA TENCOR TECH CORP
7 patentsUS7012438B1Mar 14, 2006
Methods and systems for determining a property of an insulating film
KLA TENCOR TECH CORP63 citations98
US7248062B1Jul 24, 2007
Contactless charge measurement of product wafers and control of corona generation and deposition
KLA TENCOR TECH CORP30 citations92
US7064565B1Jun 20, 2006
Methods and systems for determining an electrical property of an insulating film
KLA TENCOR TECH CORP21 citations92
US6759255B2Jul 6, 2004
Method and system for detecting metal contamination on a semiconductor wafer
KLA TENCOR TECH CORP23 citations86
US7358748B1Apr 15, 2008
Methods and systems for determining a property of an insulating film
KLA TENCOR TECH CORP14 citations84
US7719294B1May 18, 2010
Systems configured to perform a non-contact method for determining a property of a specimen
KLA TENCOR TECH CORP10 citations83
US7538333B1May 26, 2009
Contactless charge measurement of product wafers and control of corona generation and deposition
KLA TENCOR TECH CORP3 citations62
SILICON STORAGE TECH INC
5 patentsUS7280805B2Oct 9, 2007
LO leakage and sideband image calibration system and method
SILICON STORAGE TECH INC42 citations92
US7254379B2Aug 7, 2007
RF receiver mismatch calibration system and method
SILICON STORAGE TECH INC35 citations92
US7356317B2Apr 8, 2008
Adaptive-biased mixer
SILICON STORAGE TECH INC29 citations88
US7860470B2Dec 28, 2010
Cross coupled high frequency buffer
SILICON STORAGE TECH INC2 citations61
US7609122B2Oct 27, 2009
Method and system for calibration of a tank circuit in a phase lock loop
SILICON STORAGE TECH INC2 citations61
SILERGY SEMICONDUCTOR TECHNOLOGY HANGZHOU LTD
5 patentsUS11677306B2Jun 13, 2023
Inductor current reconstruction circuit, power converter and inductor current reconstruction method thereof
SILERGY SEMICONDUCTOR TECHNOLOGY HANGZHOU LTD2 citations72
US12244229B2Mar 4, 2025
Inductor current reconstruction circuit, power converter and inductor current reconstruction method thereof
SILERGY SEMICONDUCTOR TECHNOLOGY HANGZHOU LTD1 citations63
US12484132B2Nov 25, 2025
Driving circuit and driving method for switching element
SILERGY SEMICONDUCTOR TECHNOLOGY HANGZHOU LTD0 citations62
US12082506B2Sep 3, 2024
Driving circuit and driving method
SILERGY SEMICONDUCTOR TECHNOLOGY HANGZHOU LTD0 citations62
US11664747B2May 30, 2023
Driving circuit and driving method
SILERGY SEMICONDUCTOR TECHNOLOGY HANGZHOU LTD0 citations62
HONEYWELL INC
4 patentsHONEYWELL CONSUMER PRODUCTS INC
2 patentsXU ZHIWEI
2 patentsBEME INTERNAT LLC
2 patentsKLA TENCOR CORP
2 patentsKUAN YEN-CHENG
1 patentDURACRAFT CORP
1 patentHRL LAB LLC
1 patentPLUS INC G
1 patentJIAN HENG-YU
1 patentUNIV ZHEJIANG
1 patentBOE TECHNOLOGY GROUP CO LTD
1 patent(unassigned)
1 patentShowing the top 50 of 85 patents by PatentIndex Score.