Inventor
SURESH SUBRA
US18 patents
⚠️ This page may combine multiple inventors who share the name “SURESH SUBRA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MASSACHUSETTS INST TECHNOLOGY
9 patentsUS5999887ADec 7, 1999
Method and apparatus for determination of mechanical properties of functionally-graded materials
MASSACHUSETTS INST TECHNOLOGY99 citations96
US6641893B1Nov 4, 2003
Functionally-graded materials and the engineering of tribological resistance at surfaces
MASSACHUSETTS INST TECHNOLOGY201 citations94
US6247355B1Jun 19, 2001
Depth sensing indentation and methodology for mechanical property measurements
MASSACHUSETTS INST TECHNOLOGY52 citations94
US6134954AOct 24, 2000
Depth sensing indentation and methodology for mechanical property measurements
MASSACHUSETTS INST TECHNOLOGY73 citations94
US5847283ADec 8, 1998
Method and apparatus for the evaluation of a depth profile of thermo-mechanical properties of layered and graded materials and coatings
MASSACHUSETTS INST TECHNOLOGY63 citations92
US12077428B2Sep 3, 2024
Multiaxial strain engineering of defect doped materials
MASSACHUSETTS INST TECHNOLOGY0 citations60
US11996446B2May 28, 2024
Elastic strain engineering of defect doped materials
MASSACHUSETTS INST TECHNOLOGY0 citations60
US11121219B2Sep 14, 2021
Elastic strain engineering of defect doped materials
MASSACHUSETTS INST TECHNOLOGY1 citations60
US12373731B2Jul 29, 2025
Elastic strain engineering of materials
MASSACHUSETTS INST TECHNOLOGY0 citations54
CALIFORNIA INST OF TECHN
4 patentsUS6600565B1Jul 29, 2003
Real-time evaluation of stress fields and properties in line features formed on substrates
CALIFORNIA INST OF TECHN49 citations95
US6781702B2Aug 24, 2004
Determining large deformations and stresses of layered and graded structures to include effects of body forces
CALIFORNIA INST OF TECHN57 citations93
US6924497B2Aug 2, 2005
Systems for measuring stresses in line features formed on substrates
CALIFORNIA INST OF TECHN15 citations92
US6513389B2Feb 4, 2003
Technique for determining curvatures of embedded line features on substrates
CALIFORNIA INST OF TECHN22 citations92