Inventor
CHUNG SUNG SOO
KR18 patents
⚠️ This page may combine multiple inventors who share the name “CHUNG SUNG SOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CISCO TECH INC
7 patentsUS7673202B2Mar 2, 2010
Single event upset test circuit and methodology
CISCO TECH INC11 citations83
US7269770B1Sep 11, 2007
AC coupled line testing using boundary scan test methodology
CISCO TECH INC14 citations83
US7174492B1Feb 6, 2007
AC coupled line testing using boundary scan test methodology
CISCO TECH INC14 citations83
US7536617B2May 19, 2009
Programmable in-situ delay fault test clock generator
CISCO TECH INC15 citations79
US7487412B2Feb 3, 2009
Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test
CISCO TECH INC6 citations73
US7089463B1Aug 8, 2006
Test buffer design and interface mechanism for differential receiver AC/DC boundary scan test
CISCO TECH INC6 citations73
US7089470B1Aug 8, 2006
Programmable test pattern and capture mechanism for boundary scan
CISCO TECH INC7 citations71
CISCO TECH IND
3 patentsUS6446230B1Sep 3, 2002
Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests
CISCO TECH IND59 citations95
US6560739B1May 6, 2003
Mechanism for enabling compliance with the IEEE standard 1149.1 for boundary-scan designs and tests
CISCO TECH IND20 citations92
US6934921B1Aug 23, 2005
Resolving LBIST timing violations
CISCO TECH IND29 citations87