Inventor
KAWAMOTO HIROSHI
JP114 patents
⚠️ This page may combine multiple inventors who share the name “KAWAMOTO HIROSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
18 patentsUS5170374ADec 8, 1992
Semiconductor memory
HITACHI LTD329 citations99
US5157629AOct 20, 1992
Selective application of voltages for testing storage cells in semiconductor memory arrangements
HITACHI LTD260 citations99
US5278839AJan 11, 1994
Semiconductor integrated circuit having self-check and self-repair capabilities
HITACHI LTD142 citations97
US3955098AMay 4, 1976
Switching circuit having floating gate mis load transistors
HITACHI LTD68 citations96
US4893157AJan 9, 1990
Semiconductor device
HITACHI LTD34 citations93
US4839865AJun 13, 1989
Selective application of voltages for testing storage cells in semiconductor memory arrangements
HITACHI LTD33 citations93
US4660180AApr 21, 1987
Semiconductor memory device including an improved data refreshing arrangement and a system employing the same
HITACHI LTD38 citations92
US4472792ASep 18, 1984
Semiconductor memory
HITACHI LTD27 citations92
US4839860AJun 13, 1989
Semiconductor device having head only memory with differential amplifier
HITACHI LTD41 citations91
US4604749AAug 5, 1986
Semiconductor memory
HITACHI LTD18 citations80
US5448520ASep 5, 1995
Semiconductor memory
HITACHI LTD10 citations74
US5187685AFeb 16, 1993
Complementary MISFET voltage generating circuit for a semiconductor memory
HITACHI LTD10 citations74
US4860255AAug 22, 1989
Semiconductor memory
HITACHI LTD8 citations74
US4695864ASep 22, 1987
Dynamic storage device with extended information holding time
HITACHI LTD7 citations74
US4646267AFeb 24, 1987
Semiconductor memory
HITACHI LTD10 citations74
US4592022AMay 27, 1986
Semiconductor memory
HITACHI LTD10 citations74
US4539658ASep 3, 1985
Semiconductor memory
HITACHI LTD9 citations74
US4491858AJan 1, 1985
Dynamic storage device with extended information holding time
HITACHI LTD13 citations74
FUJI PHOTO FILM CO LTD
12 patentsUS5994546ANov 30, 1999
4-(N,N-dialklylamino)aniline compounds, photographic processing composition containing the same and color image-forming method
FUJI PHOTO FILM CO LTD21 citations93
US5334493AAug 2, 1994
Photographic processing solution having a stabilizing ability and a method for processing a silver halide color photographic light-sensitive material
FUJI PHOTO FILM CO LTD48 citations93
US5270148ADec 14, 1993
Processing solution for silver halide color photographic materials and method for processing the materials with the processing solution
FUJI PHOTO FILM CO LTD24 citations93
US5418124AMay 23, 1995
Silver halide photographic emulsion and a photographic light-sensitive material
FUJI PHOTO FILM CO LTD20 citations92
US5527664AJun 18, 1996
Method of preparing silver halide photographic emulsion, emulsion, and light-sensitive material
FUJI PHOTO FILM CO LTD8 citations74
US5482826AJan 9, 1996
Method for forming silver halide grains and a method for producing a silver halide photographic material
FUJI PHOTO FILM CO LTD9 citations74
US5449593ASep 12, 1995
Processing solution for silver halide color photographic materials and method for processing the materials with use of the processing solutions
FUJI PHOTO FILM CO LTD9 citations74
US5389508AFeb 14, 1995
Silver halide photographic light-sensitive material
FUJI PHOTO FILM CO LTD16 citations74
US5348845ASep 20, 1994
Color image-stabilization processing solution used for processing a silver halide color photographic material and a processing method using the same
FUJI PHOTO FILM CO LTD8 citations74
US5204214AApr 20, 1993
Silver halide photographic material
FUJI PHOTO FILM CO LTD8 citations74
US4673632AJun 16, 1987
Hardening method for gelatin
FUJI PHOTO FILM CO LTD18 citations74
US4612280ASep 16, 1986
Hardened gelatin and method for hardening gelatin
FUJI PHOTO FILM CO LTD12 citations74
ADVANTEST CORP
5 patentsUS5757198AMay 26, 1998
Method and apparatus for detecting an IC defect using charged particle beam
ADVANTEST CORP63 citations95
US5821761AOct 13, 1998
Apparatus detecting an IC defect by comparing electron emissions from two integrated circuits
ADVANTEST CORP19 citations91
US5640098AJun 17, 1997
IC fault analysis system having charged particle beam tester
ADVANTEST CORP27 citations91
US5592100AJan 7, 1997
Method for detecting an IC defect using charged particle beam
ADVANTEST CORP28 citations91
US5521517AMay 28, 1996
Method and apparatus for detecting an IC defect using a charged particle beam
ADVANTEST CORP27 citations91
BANYU PHARMA CO LTD
4 patentsUS7125877B2Oct 24, 2006
Benzimidazole derivatives
BANYU PHARMA CO LTD25 citations92
US6258825B1Jul 10, 2001
2-oxoimidazole derivatives
BANYU PHARMA CO LTD30 citations91
US6969712B2Nov 29, 2005
Benzimidazole derivatives
BANYU PHARMA CO LTD17 citations84
US7300947B2Nov 27, 2007
N-dihydroxyalkyl-substituted 2-oxo-imidazole derivatives
BANYU PHARMA CO LTD11 citations82
TOSHIBA KK
3 patentsUS5943578AAug 24, 1999
Method of manufacturing a semiconductor device having an element isolating region
TOSHIBA KK25 citations92
US5878191AMar 2, 1999
Heat treatment apparatus for semiconductor wafers
TOSHIBA KK22 citations92
US6004840ADec 21, 1999
Method of fabricating a semiconductor device comprising a MOS portion and a bipolar portion
TOSHIBA KK9 citations74
SHARP KK
3 patentsUS6035168AMar 7, 2000
Developing device having a reduced width in the horizontal direction
SHARP KK32 citations91
US5619312AApr 8, 1997
Developing device with developer-supplying mechanism
SHARP KK42 citations89
US6678482B2Jan 13, 2004
Image forming apparatus and method for determining suitability of replaceable component
SHARP KK14 citations83
FUJIFILM CORP
2 patentsKAWAMOTO HIROSHI
1 patentHONDA MOTOR CO LTD
1 patentTOYOTA MOTOR CO LTD
1 patentShowing the top 50 of 114 patents by PatentIndex Score.