Inventor
WALTHER RONALD GENE
9 patents
Patents
9 patentsUS6055658AApr 25, 2000
Apparatus and method for testing high speed components using low speed test apparatus
IBM65 citations94
US4063080ADec 13, 1977
Method of propagation delay testing a level sensitive array logic system
IBM48 citations93
US4051352ASep 27, 1977
Level sensitive embedded array logic system
IBM41 citations93
US5887004AMar 23, 1999
Isolated scan paths
IBM29 citations91
US5787098AJul 28, 1998
Complete chip I/O test through low contact testing using enhanced boundary scan
IBM24 citations90
US4074851AFeb 21, 1978
Method of level sensitive testing a functional logic system with embedded array
IBM35 citations89
US7610537B2Oct 27, 2009
Method and apparatus for testing multi-core microprocessors
IBM34 citations86
US6507929B1Jan 14, 2003
System and method for diagnosing and repairing errors in complementary logic
IBM14 citations84
US6253350B1Jun 26, 2001
Method and system for detecting errors within complementary logic circuits
IBM14 citations73