Inventor
MAMETANI TOMOHARU
JP15 patents
⚠️ This page may combine multiple inventors who share the name “MAMETANI TOMOHARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
12 patentsUS5478759ADec 26, 1995
Method of manufacturing semiconductor device with retrograde wells
MITSUBISHI ELECTRIC CORP98 citations96
US6175156B1Jan 16, 2001
Semiconductor device with improved interconnection
MITSUBISHI ELECTRIC CORP35 citations92
US5289422AFeb 22, 1994
Semiconductor device having dummy wiring pattern therein and manufacturing method thereof
MITSUBISHI ELECTRIC CORP25 citations92
US6040615AMar 21, 2000
Semiconductor device with moisture resistant fuse portion
MITSUBISHI ELECTRIC CORP17 citations84
US6337268B1Jan 8, 2002
Method of manufacturing contact structure
MITSUBISHI ELECTRIC CORP7 citations72
US6313005B1Nov 6, 2001
Method of manufacturing semiconductor device
MITSUBISHI ELECTRIC CORP7 citations72
US6251741B1Jun 26, 2001
Method of manufacturing a semiconductor device
MITSUBISHI ELECTRIC CORP3 citations62
US5770491AJun 23, 1998
Manufacturing process of a MOS semiconductor device
MITSUBISHI ELECTRIC CORP2 citations62
US4933257AJun 12, 1990
Positive quinone diazide photo-resist composition with antistatic agent
MITSUBISHI ELECTRIC CORP3 citations62
US5234859AAug 10, 1993
LOCOS type field isolating film and semiconductor memory device formed therewith
MITSUBISHI ELECTRIC CORP6 citations59
US5065218ANov 12, 1991
Locos type field isolating film and semiconductor memory device formed therewith
MITSUBISHI ELECTRIC CORP2 citations59
US5168030ADec 1, 1992
Positive type o-quinone diazide photo-resist containing antistatic agent selected from hydrazones, ethylcarbazole and bis(dimethylamino)benzene
MITSUBISHI ELECTRIC CORP1 citations51
RENESAS TECH CORP
3 patentsUS6787878B1Sep 7, 2004
Semiconductor device having a potential fuse, and method of manufacturing the same
RENESAS TECH CORP17 citations82
US6673671B1Jan 6, 2004
Semiconductor device, and method of manufacturing the same
RENESAS TECH CORP3 citations62
US6744143B1Jun 1, 2004
Semiconductor device having test mark
RENESAS TECH CORP5 citations61