Inventor

BAUTISTA JR EDWARD V

US19 patents

⚠️ This page may combine multiple inventors who share the name “BAUTISTA JR EDWARD V”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BAUTISTA JR EDWARD V

ADVANCED MICRO DEVICES INC

Address sequencer within BIST (Built-in-Self-Test) system

On-chip repair of defective address of core flash memory cells

On-chip erase pulse counter for efficient erase verify BIST (built-in-self-test) mode

Method and system for embedded chip erase verification

Diagnostic mode for testing functionality of BIST (built-in-self-test) back-end state machine

Charge sharing to help boost the wordlines during APDE verify

I/O partitioning system and methodology to reduce band-to-band tunneling current during erase

Application of external voltage during array VT testing

Method and apparatus for pre-charging negative pump MOS regulation capacitors

System and method to facilitate stabilization of reference voltage signals in memory devices

Memory device and method

Memory device and method

CAM (content addressable memory) cells as part of core array in flash memory device

System and method to facilitate stabilization of reference voltage signals in memory devices

Wordline voltage protection

Voltage protection of write protect cams

Implementing reference current measurement mode within reference array programming mode or reference array erase mode in a semiconductor

PARKER ALLAN

Implementation of recycling unused ECC parity bits during flash memory programming

ADVANCED MICRO DEVICES IN

Method and apparatus for soft program verification in a memory device