Inventor
BUI NGUYEN D
US7 patents
Patents
7 patentsUS6320391B1Nov 20, 2001
Interconnection device for low and high current stress electromigration and correlation study
ADVANCED MICRO DEVICES INC65 citations94
US6472233B1Oct 29, 2002
MOSFET test structure for capacitance-voltage measurements
ADVANCED MICRO DEVICES INC45 citations91
US5598009AJan 28, 1997
Hot carrier injection test structure and testing technique for statistical evaluation
ADVANCED MICRO DEVICES INC18 citations91
US6100101AAug 8, 2000
Sensitive technique for metal-void detection
ADVANCED MICRO DEVICES INC9 citations71
US6005409ADec 21, 1999
Detection of process-induced damage on transistors in real time
ADVANCED MICRO DEVICES INC8 citations71
US5612627AMar 18, 1997
Method for evaluating the effect of a barrier layer on electromigration for plug and non-plug interconnect systems
ADVANCED MICRO DEVICES INC10 citations71
US5966024AOct 12, 1999
Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle
ADVANCED MICRO DEVICES INC16 citations68