Inventor
KIM CHANG-NYUN
KR5 patents
Patents
5 patentsUS6819129B2Nov 16, 2004
Method and apparatus for testing a non-standard memory device under actual operating conditions
SAMSUNG ELECTRONICS CO LTD17 citations80
US6771088B2Aug 3, 2004
Method and apparatus for testing semiconductor devices using the back side of a circuit board
SAMSUNG ELECTRONICS CO LTD6 citations72
US7075325B2Jul 11, 2006
Method and apparatus for testing semiconductor devices using an actual board-type product
SAMSUNG ELECTRONICS CO LTD9 citations71
US6833721B2Dec 21, 2004
Method and apparatus for testing semiconductor devices using an actual board-type product
SAMSUNG ELECTRONICS CO LTD7 citations71
US7256594B2Aug 14, 2007
Method and apparatus for testing semiconductor devices using the back side of a circuit board
SAMSUNG ELECTRONICS CO LTD2 citations61