Inventor
FUKUSHI JUKIYA
JP6 patents
Patents
6 patentsUS11624679B2Apr 11, 2023
Optical probe, optical probe array, test system and test method
NIHON MICRONICS KK2 citations71
US11971296B2Apr 30, 2024
Measurement system and measurement method
NIHON MICRONICS KK2 citations70
US11971431B2Apr 30, 2024
Optical probe, optical probe array, optical probe card, and method of manufacturing optical probe
NIHON MICRONICS KK2 citations70
US12360155B2Jul 15, 2025
Optical probe, probe card, measuring system, and measuring method
NIHON MICRONICS KK0 citations60
US12031921B2Jul 9, 2024
Measurement system
NIHON MICRONICS KK1 citations60
US11860190B2Jan 2, 2024
Probe unit with a free length cantilever contactor and pedestal
NIHON MICRONICS KK1 citations59