Inventor
SHIMIZU NOBUHIRO
JP34 patents
⚠️ This page may combine multiple inventors who share the name “SHIMIZU NOBUHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SEIKO INSTR INC
20 patentsUS5877412AMar 2, 1999
Probe for atomic force microscope and atomic force microscope
SEIKO INSTR INC33 citations93
US6469293B1Oct 22, 2002
Multiprobe and scanning probe microscope
SEIKO INSTR INC28 citations92
US6422069B1Jul 23, 2002
Self-exciting and self-detecting probe and scanning probe apparatus
SEIKO INSTR INC41 citations92
US6383823B1May 7, 2002
Probe for scanning probe microscope (SPM) and SPM device
SEIKO INSTR INC26 citations92
US6211540B1Apr 3, 2001
Semiconductor strain sensor and scanning probe microscope using the semiconductor strain sensor
SEIKO INSTR INC22 citations92
US6171437B1Jan 9, 2001
Semiconductor manufacturing device
SEIKO INSTR INC27 citations92
US5825183AOct 20, 1998
Radial differential squid magnetic flux meter
SEIKO INSTR INC23 citations92
US5548130AAug 20, 1996
DC superconducting quantum interference device with shield layer
SEIKO INSTR INC30 citations92
US6667467B2Dec 23, 2003
Microprobe and scanning probe apparatus having microprobe
SEIKO INSTR INC30 citations91
US6388252B1May 14, 2002
Self-detecting type of SPM probe and SPM device
SEIKO INSTR INC16 citations84
US6358426B1Mar 19, 2002
Method of fabricating probe force atomic force microscope
SEIKO INSTR INC14 citations84
US6664540B2Dec 16, 2003
Microprobe and sample surface measuring apparatus
SEIKO INSTR INC14 citations83
US6405583B1Jun 18, 2002
Correlation sample for scanning probe microscope and method of processing the correlation sample
SEIKO INSTR INC16 citations83
US6176122B1Jan 23, 2001
Cantilever unit and scanning probe microscope utilizing the cantilever unit
SEIKO INSTR INC8 citations74
US6049115AApr 11, 2000
Scanning probe microscope, and semiconductor distortion sensor for use therein
SEIKO INSTR INC12 citations74
US5992225ANov 30, 1999
Cantilever probe and scanning type probe microscope utilizing the cantilever probe
SEIKO INSTR INC10 citations74
US5231353AJul 27, 1993
Apparatus for detecting a fine magnetic field with a signal adjusting circuit in a dc squid
SEIKO INSTR INC11 citations74
US5306521AApr 26, 1994
Process for manufacturing DC superconducting quantum interference device
SEIKO INSTR INC15 citations73
US5406201AApr 11, 1995
Magnetic field detecting circuit having a relaxation oscillator SQUID
SEIKO INSTR INC16 citations72
US5173659ADec 22, 1992
Highly sensitive magnetic field detecting SQUID with dual demodulation circuit
SEIKO INSTR INC6 citations58
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
9 patentsUS6806647B2Oct 19, 2004
Light source device with discontinuous electrode contact portions and liquid crystal display
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD15 citations84
US6946796B2Sep 20, 2005
Light source device and liquid crystal display employing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD10 citations74
US6806648B2Oct 19, 2004
Light source device and liquid crystal display device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD9 citations74
US7276851B2Oct 2, 2007
Discharge lamp device and backlight having external electrode unit
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD7 citations71
US6611592B1Aug 26, 2003
Incoming-call tone generation device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD11 citations69
US6906461B2Jun 14, 2005
Light source device with inner and outer electrodes and liquid crystal display device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2 citations63
US6891334B2May 10, 2005
Light source device and liquid crystal display employing the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD5 citations63
US6903518B2Jun 7, 2005
Discharge lamp device and backlight using the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD1 citations52
US7282861B2Oct 16, 2007
Light source device, lighting device and liquid crystal display device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD0 citations40