Inventor

BOUGHORBEL FAYSAL

NL17 patents

⚠️ This page may combine multiple inventors who share the name “BOUGHORBEL FAYSAL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BOUGHORBEL FAYSAL

FEI CO

Mathematical image assembly in a scanning-type microscope

Method of examining a sample in a charged-particle microscope

Charged particle microscope providing depth-resolved imagery

X-ray imaging technique

Computational scanning microscopy with improved resolution

Charged particle microscope with special aperture plate

Method, device and system for remote deep learning for microscopic image reconstruction and segmentation

Method, device and system for remote deep learning for microscopic image reconstruction and segmentation

Charged-particle microscope providing depth-resolved imagery

Method of analyzing surface modification of a specimen in a charged-particle microscope

Method of analyzing surface modification of a specimen in a charged-particle microscope

Three-dimensional imaging in charged-particle microscopy

BOUGHORBEL FAYSAL

SEM imaging method

Charged-particle microscope providing depth-resolved imagery

Charged particle microscopy imaging method

Method for determining a depth map from images, device for determining a depth map

PHIFER JR DANIEL WOODROW

Charged-particle microscopy with occlusion detection