P

Inventor

CHO KWANG JUN

KR25 patents
⚠️ This page may combine multiple inventors who share the name “CHO KWANG JUN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HYNIX SEMICONDUCTOR INC

19 patents
US7463534B2Dec 9, 2008

Write apparatus for DDR SDRAM semiconductor memory device

HYNIX SEMICONDUCTOR INC44 citations92
US7423468B2Sep 9, 2008

Duty correction circuit of digital type for optimal layout area and current consumption

HYNIX SEMICONDUCTOR INC26 citations92
US7684255B2Mar 23, 2010

Method of operating a non-volatile memory device

HYNIX SEMICONDUCTOR INC10 citations84
US7671646B2Mar 2, 2010

Delay locked loop

HYNIX SEMICONDUCTOR INC9 citations84
US7548100B2Jun 16, 2009

Delay locked loop

HYNIX SEMICONDUCTOR INC8 citations84
US7414447B2Aug 19, 2008

Semiconductor memory device including delay-locked-loop control circuit and control method for effective current consumption management

HYNIX SEMICONDUCTOR INC9 citations84
US7317341B2Jan 8, 2008

Duty correction device

HYNIX SEMICONDUCTOR INC13 citations84
US6970393B1Nov 29, 2005

Pulse generating circuit for self-refresh

HYNIX SEMICONDUCTOR INC16 citations84
US7642823B2Jan 5, 2010

Semiconductor memory device including delay-locked-loop control circuit and control method for effective current consumption management

HYNIX SEMICONDUCTOR INC6 citations73
US7629824B2Dec 8, 2009

Duty correction circuit of digital type for optimal layout area and current consumption

HYNIX SEMICONDUCTOR INC5 citations73
US6759293B2Jul 6, 2004

Method for manufacturing a capacitor in a semiconductor device

HYNIX SEMICONDUCTOR INC3 citations63
US7834674B2Nov 16, 2010

Delay circuit and delay locked loop circuit including the same

HYNIX SEMICONDUCTOR INC3 citations62
US7276959B2Oct 2, 2007

Pumping circuit of semiconductor device

HYNIX SEMICONDUCTOR INC2 citations62
US8027210B2Sep 27, 2011

Data input apparatus with improved setup/hold window

HYNIX SEMICONDUCTOR INC0 citations52
US7843748B2Nov 30, 2010

Test apparatus of semiconductor integrated circuit and method using the same

HYNIX SEMICONDUCTOR INC0 citations52
US6709916B2Mar 23, 2004

Method for forming capacitor of semiconductor device

HYNIX SEMICONDUCTOR INC0 citations52
US6653197B2Nov 25, 2003

Method for fabricating capacitor of semiconductor device

HYNIX SEMICONDUCTOR INC0 citations52
US8384448B2Feb 26, 2013

DLL circuit and method of controlling the same

HYNIX SEMICONDUCTOR INC0 citations41
US7928786B2Apr 19, 2011

Clock buffer circuit of semiconductor device configured to generate an internal clock signal

HYNIX SEMICONDUCTOR INC0 citations41

CHO KWANG JUN

4 patents

HYUNDAI ELECTRONICS IND

1 patent

KIM JONG-SAM

1 patent