Inventor
ZHANG KAIFENG
CN17 patents
⚠️ This page may combine multiple inventors who share the name “ZHANG KAIFENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
6 patentsUS12436097B2Oct 7, 2025
Spectroscopic measurement device
HITACHI HIGH TECH CORP0 citations62
US12292330B2May 6, 2025
Spectrometry apparatus
HITACHI HIGH TECH CORP0 citations51
US11733264B2Aug 22, 2023
Cantilever, scanning probe microscope, and measurement method using scanning probe microscope
HITACHI HIGH TECH CORP0 citations51
US8787134B2Jul 22, 2014
Thermally assisted magnetic recording head inspection method and apparatus
HITACHI HIGH TECH CORP0 citations51
US8713710B2Apr 29, 2014
Cantilever of scanning probe microscope and method for manufacturing the same, method for inspecting thermal assist type magnetic head device and its apparatus
HITACHI HIGH TECH CORP1 citations48
US10352879B2Jul 16, 2019
X-ray inspection method and device
HITACHI HIGH TECH CORP0 citations41
HITACHI LTD
2 patentsUS10877065B2Dec 29, 2020
Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method
HITACHI LTD1 citations62
US10429411B2Oct 1, 2019
Near field scanning probe microscope, probe for scanning probe microscope, and sample observation method
HITACHI LTD0 citations51