Inventor · disambiguated record
Patrick P. Fasang
Also filed as: FASANG PATRICK P
5 granted patents·644 citations·filing 1981–1990
87Inventor score
Top patents by PatentIndex Score
5 records- 0197US5138619ABuilt-in self test for integrated circuit memoryNAT SEMICONDUCTOR CORP·Filed 1990·Granted Aug 11, 1992·268 cites·15 claims
- 0297US4602210AMultiplexed-access scan testable integrated circuitGEN ELECTRIC·Filed 1984·Granted Jul 22, 1986·196 cites·9 claims
- 0394US4433413ABuilt-in apparatus and method for testing a microprocessor systemSIEMENS CORP·Filed 1981·Granted Feb 21, 1984·105 cites·10 claims
- 0481US4340857ADevice for testing digital circuits using built-in logic block observers (BILBO's)SIEMENS CORP·Filed 1981·Granted Jul 20, 1982·39 cites·16 claims
- 0572US4922492AArchitecture and device for testable mixed analog and digital VLSI circuitsNAT SEMICONDUCTOR CORP·Filed 1988·Granted May 1, 1990·36 cites·23 claims
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