Inventor
WIGGIN ROBERT N
US3 patents
Patents
3 patentsUS6391669B1May 21, 2002
Embedded structures to provide electrical testing for via to via and interface layer alignment as well as for conductive interface electrical integrity in multilayer devices
IBM71 citations91
US6429672B2Aug 6, 2002
Contamination-tolerant electrical test probe
IBM3 citations60
US6753688B2Jun 22, 2004
Interconnect package cluster probe short removal apparatus and method
IBM3 citations56