Inventor
PRAMANICK ANKAN
US15 patents
⚠️ This page may combine multiple inventors who share the name “PRAMANICK ANKAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST AMERICA R & D CT INC
6 patentsUS7209851B2Apr 24, 2007
Method and structure to develop a test program for semiconductor integrated circuits
ADVANTEST AMERICA R & D CT INC60 citations96
US7184917B2Feb 27, 2007
Method and system for controlling interchangeable components in a modular test system
ADVANTEST AMERICA R & D CT INC63 citations96
US7197417B2Mar 27, 2007
Method and structure to develop a test program for semiconductor integrated circuits
ADVANTEST AMERICA R & D CT INC44 citations90
US7210087B2Apr 24, 2007
Method and system for simulating a modular test system
ADVANTEST AMERICA R & D CT INC32 citations88
US7430486B2Sep 30, 2008
Datalog support in a modular test system
ADVANTEST AMERICA R & D CT INC8 citations72
US7197416B2Mar 27, 2007
Supporting calibration and diagnostics in an open architecture test system
ADVANTEST AMERICA R & D CT INC8 citations72
ADVANTEST CORP
6 patentsUS7437261B2Oct 14, 2008
Method and apparatus for testing integrated circuits
ADVANTEST CORP17 citations91
US9785542B2Oct 10, 2017
Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing
ADVANTEST CORP5 citations69
US7543200B2Jun 2, 2009
Method and system for scheduling tests in a parallel test system
ADVANTEST CORP6 citations62
US7194668B2Mar 20, 2007
Event based test method for debugging timing related failures in integrated circuits
ADVANTEST CORP2 citations56
US9274911B2Mar 1, 2016
Using shared pins in a concurrent test execution environment
ADVANTEST CORP0 citations46
US9785526B2Oct 10, 2017
Automated generation of a test class pre-header from an interactive graphical user interface
ADVANTEST CORP0 citations37