Inventor
PLASS DONALD W
US54 patents
⚠️ This page may combine multiple inventors who share the name “PLASS DONALD W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IBM
44 patentsUS7064990B1Jun 20, 2006
Method and apparatus for implementing multiple column redundancy for memory
IBM29 citations92
US7437626B2Oct 14, 2008
Efficient method of test and soft repair of SRAM with redundancy
IBM21 citations91
US7471590B2Dec 30, 2008
Write control circuitry and method for a memory array configured with multiple memory subarrays
IBM11 citations84
US7173875B2Feb 6, 2007
SRAM array with improved cell stability
IBM10 citations84
US7088638B1Aug 8, 2006
Global and local read control synchronization method and system for a memory array configured with multiple memory subarrays
IBM17 citations84
US7075855B1Jul 11, 2006
Memory output timing control circuit with merged functions
IBM16 citations84
US7953987B2May 31, 2011
Protection of secure electronic modules against attacks
IBM13 citations83
US7793173B2Sep 7, 2010
Efficient memory product for test and soft repair of SRAM with redundancy
IBM11 citations83
US7787284B2Aug 31, 2010
Integrated circuit chip with improved array stability
IBM5 citations74
US7606060B2Oct 20, 2009
Eight transistor SRAM cell with improved stability requiring only one word line
IBM7 citations74
US7295458B2Nov 13, 2007
Eight transistor SRAM cell with improved stability requiring only one word line
IBM7 citations74
US7085173B1Aug 1, 2006
Write driver circuit for memory array
IBM8 citations74
US4901279AFeb 13, 1990
MESFET sram with power saving current-limiting transistors
IBM9 citations74
US7283417B2Oct 16, 2007
Write control circuitry and method for a memory array configured with multiple memory subarrays
IBM8 citations73
US7176725B2Feb 13, 2007
Fast pulse powered NOR decode apparatus for semiconductor devices
IBM9 citations73
US7099206B2Aug 29, 2006
High density bitline selection apparatus for semiconductor memory devices
IBM7 citations73
US6728912B2Apr 27, 2004
SOI cell stability test method
IBM11 citations73
US10559346B2Feb 11, 2020
Bias-controlled bit-line sensing scheme for eDRAM
IBM2 citations72
US7219275B2May 15, 2007
Method and apparatus for providing flexible modular redundancy allocation for memory built in self test of SRAM with redundancy
IBM7 citations72
US10943647B1Mar 9, 2021
Bit-line mux driver with diode header for computer memory
IBM5 citations71
US10930339B1Feb 23, 2021
Voltage bitline high (VBLH) regulation for computer memory
IBM3 citations68
US7295457B2Nov 13, 2007
Integrated circuit chip with improved array stability
IBM2 citations63
US7233542B2Jun 19, 2007
Method and apparatus for address generation
IBM5 citations63
US7102944B1Sep 5, 2006
Programmable analog control of a bitline evaluation circuit
IBM3 citations63
US7023759B1Apr 4, 2006
System and method for synchronizing memory array signals
IBM2 citations63
US7009895B2Mar 7, 2006
Method for skip over redundancy decode with very low overhead
IBM5 citations63
US6822885B2Nov 23, 2004
High speed latch and compare function
IBM3 citations63
US6584023B1Jun 24, 2003
System for implementing a column redundancy scheme for arrays with controls that span multiple data bits
IBM6 citations63
US9250271B2Feb 2, 2016
Charge pump generator with direct voltage sensor
IBM2 citations62
US9025403B1May 5, 2015
Dynamic cascode-managed high-voltage word-line driver circuit
IBM2 citations62
US7688650B2Mar 30, 2010
Write control method for a memory array configured with multiple memory subarrays
IBM2 citations62
US7299374B2Nov 20, 2007
Clock control method and apparatus for a memory array
IBM2 citations62
US7068554B1Jun 27, 2006
Apparatus and method for implementing multiple memory redundancy with delay tracking clock
IBM4 citations62
US10832756B1Nov 10, 2020
Negative voltage generation for computer memory
IBM1 citations60
US9263096B1Feb 16, 2016
Voltage comparator circuit and usage thereof
IBM2 citations60
US7403412B2Jul 22, 2008
Integrated circuit chip with improved array stability
IBM0 citations52
US7266737B2Sep 4, 2007
Method for enabling scan of defective ram prior to repair
IBM0 citations52
US10762953B2Sep 1, 2020
Memory array with reduced circuitry
IBM0 citations51
US9748958B2Aug 29, 2017
Dynamic high voltage driver with adjustable clamped output level
IBM0 citations51
US9053770B1Jun 9, 2015
Dynamic cascode-managed high-voltage word-line driver circuit
IBM0 citations51
US7380191B2May 27, 2008
ABIST data compression and serialization for memory built-in self test of SRAM with redundancy
IBM1 citations51
US7170320B2Jan 30, 2007
Fast pulse powered NOR decode apparatus with pulse stretching and redundancy steering
IBM1 citations51
US9099200B2Aug 4, 2015
SRAM restore tracking circuit and method
IBM0 citations50
US9299458B1Mar 29, 2016
Voltage comparator circuit and usage thereof
IBM0 citations49
GLOBALFOUNDRIES INC
2 patentsREOHR WILLIAM ROBERT
1 patentDAWSON JAMES W
1 patentBARTH JR JOHN E
1 patentHWANG CHARLIE C
1 patentShowing the top 50 of 54 patents by PatentIndex Score.