Inventor
TOLSMA HOITE PIETER THEODOOR
NL19 patents
⚠️ This page may combine multiple inventors who share the name “TOLSMA HOITE PIETER THEODOOR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ASML NETHERLANDS BV
17 patentsUS7880880B2Feb 1, 2011
Alignment systems and methods for lithographic systems
ASML NETHERLANDS BV24 citations95
US7332732B2Feb 19, 2008
Alignment systems and methods for lithographic systems
ASML NETHERLANDS BV22 citations94
US7329888B2Feb 12, 2008
Alignment systems and methods for lithographic systems
ASML NETHERLANDS BV18 citations91
US7297971B2Nov 20, 2007
Alignment systems and methods for lithographic systems
ASML NETHERLANDS BV12 citations91
US7259828B2Aug 21, 2007
Alignment system and method and device manufactured thereby
ASML NETHERLANDS BV25 citations86
US10317191B2Jun 11, 2019
Methods and apparatus for measuring a property of a substrate
ASML NETHERLANDS BV4 citations82
US7002667B2Feb 21, 2006
Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby
ASML NETHERLANDS BV15 citations82
US9594029B2Mar 14, 2017
Methods and apparatus for measuring a property of a substrate
ASML NETHERLANDS BV4 citations81
US6995831B2Feb 7, 2006
Lithographic apparatus with alignment subsystem, device manufacturing method, using alignment, and alignment structure
ASML NETHERLANDS BV8 citations72
US10996176B2May 4, 2021
Methods and apparatus for measuring a property of a substrate
ASML NETHERLANDS BV2 citations71
US10746668B2Aug 18, 2020
Methods and apparatus for measuring a property of a substrate
ASML NETHERLANDS BV2 citations71
US7439531B2Oct 21, 2008
Alignment systems and methods for lithographic systems
ASML NETHERLANDS BV7 citations71
US7409302B2Aug 5, 2008
Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus
ASML NETHERLANDS BV6 citations70
US11977034B2May 7, 2024
Methods and apparatus for measuring a property of a substrate
ASML NETHERLANDS BV0 citations61
US7410735B2Aug 12, 2008
Method of characterization, method of characterizing a process operation, and device manufacturing method
ASML NETHERLANDS BV5 citations54
US10705438B2Jul 7, 2020
Lithographic method
ASML NETHERLANDS BV0 citations48
US10571814B2Feb 25, 2020
Lithographic method
ASML NETHERLANDS BV0 citations48