P

Inventor

TOLSMA HOITE PIETER THEODOOR

NL19 patents
⚠️ This page may combine multiple inventors who share the name “TOLSMA HOITE PIETER THEODOOR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASML NETHERLANDS BV

17 patents
US7880880B2Feb 1, 2011

Alignment systems and methods for lithographic systems

ASML NETHERLANDS BV24 citations95
US7332732B2Feb 19, 2008

Alignment systems and methods for lithographic systems

ASML NETHERLANDS BV22 citations94
US7329888B2Feb 12, 2008

Alignment systems and methods for lithographic systems

ASML NETHERLANDS BV18 citations91
US7297971B2Nov 20, 2007

Alignment systems and methods for lithographic systems

ASML NETHERLANDS BV12 citations91
US7259828B2Aug 21, 2007

Alignment system and method and device manufactured thereby

ASML NETHERLANDS BV25 citations86
US10317191B2Jun 11, 2019

Methods and apparatus for measuring a property of a substrate

ASML NETHERLANDS BV4 citations82
US7002667B2Feb 21, 2006

Lithographic apparatus with alignment subsystem, device manufacturing method, and device manufactured thereby

ASML NETHERLANDS BV15 citations82
US9594029B2Mar 14, 2017

Methods and apparatus for measuring a property of a substrate

ASML NETHERLANDS BV4 citations81
US6995831B2Feb 7, 2006

Lithographic apparatus with alignment subsystem, device manufacturing method, using alignment, and alignment structure

ASML NETHERLANDS BV8 citations72
US10996176B2May 4, 2021

Methods and apparatus for measuring a property of a substrate

ASML NETHERLANDS BV2 citations71
US10746668B2Aug 18, 2020

Methods and apparatus for measuring a property of a substrate

ASML NETHERLANDS BV2 citations71
US7439531B2Oct 21, 2008

Alignment systems and methods for lithographic systems

ASML NETHERLANDS BV7 citations71
US7409302B2Aug 5, 2008

Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus

ASML NETHERLANDS BV6 citations70
US11977034B2May 7, 2024

Methods and apparatus for measuring a property of a substrate

ASML NETHERLANDS BV0 citations61
US7410735B2Aug 12, 2008

Method of characterization, method of characterizing a process operation, and device manufacturing method

ASML NETHERLANDS BV5 citations54
US10705438B2Jul 7, 2020

Lithographic method

ASML NETHERLANDS BV0 citations48
US10571814B2Feb 25, 2020

Lithographic method

ASML NETHERLANDS BV0 citations48

VAN BILSEN FRANCISCUS BERNARDUS MARIA

1 patent

BIJNEN FRANCISCUS GODEFRIDUS CASPER

1 patent