Inventor

KUHN JUSTUS

DE19 patents

⚠️ This page may combine multiple inventors who share the name “KUHN JUSTUS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

KUHN JUSTUS

INFINEON TECHNOLOGIES AG

Method of matching different signal propagation times between a controller and at least two processing units, and a computer system

System for testing fast synchronous semiconductor circuits

Method and device for reading and for checking the time position of data response signals read out from a memory module to be tested

System for testing fast integrated digital circuits, in particular semiconductor memory modules

Field-effect-controlled transistor and method for fabricating the transistor

Test circuit for testing a synchronous memory circuit

Test circuit for testing a circuit

Method and probe card configuration for testing a plurality of integrated circuits in parallel

Self test for the phase angle of the data read clock signal DQS

System for testing fast synchronous digital circuits, particularly semiconductor memory chips

Test data generator

Address counter for addressing synchronous high-frequency digital circuits, in particular memory devices

Circuit configuration for generating control signals for testing high-frequency synchronous digital circuits

Method and apparatus for synchronous signal transmission between at least two logic or memory components

Device and method for reducing the number of addresses of faulty memory cells

Method and device for generating digital signal patterns

Address generator for generating addresses for testing a circuit

(unassigned)

Test circuit

INFINEON TECHOLOGIES AG

Test configuration and test method for testing a plurality of integrated circuits in parallel