Inventor
SPIRKL WOLFGANG
DE30 patents
⚠️ This page may combine multiple inventors who share the name “SPIRKL WOLFGANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INFINEON TECHNOLOGIES AG
20 patentsUS7439761B2Oct 21, 2008
Apparatus and method for controlling a driver strength
INFINEON TECHNOLOGIES AG15 citations84
US6639862B2Oct 28, 2003
Semiconductor memory with refresh and method for operating the semiconductor memory
INFINEON TECHNOLOGIES AG18 citations84
US6812689B2Nov 2, 2004
Method and device for offset-voltage free voltage measurement and adjustment of a reference voltage source of an integrated semiconductor circuit
INFINEON TECHNOLOGIES AG7 citations73
US6779136B2Aug 17, 2004
Method for testing the refresh device of an information memory
INFINEON TECHNOLOGIES AG10 citations73
US6459649B2Oct 1, 2002
Address generator for generating addresses for an on-chip trim circuit
INFINEON TECHNOLOGIES AG9 citations73
US7649130B2Jan 19, 2010
Integrated circuit
INFINEON TECHNOLOGIES AG3 citations62
US7515456B2Apr 7, 2009
Memory circuit, a dynamic random access memory, a system comprising a memory and a floating point unit and a method for storing digital data
INFINEON TECHNOLOGIES AG4 citations62
US7489153B2Feb 10, 2009
Semiconductor memory device
INFINEON TECHNOLOGIES AG4 citations62
US7398444B2Jul 8, 2008
Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods
INFINEON TECHNOLOGIES AG4 citations62
US7331005B2Feb 12, 2008
Semiconductor circuit device and a system for testing a semiconductor apparatus
INFINEON TECHNOLOGIES AG4 citations62
US7308628B2Dec 11, 2007
Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits
INFINEON TECHNOLOGIES AG2 citations62
US7307895B2Dec 11, 2007
Self test for the phase angle of the data read clock signal DQS
INFINEON TECHNOLOGIES AG3 citations62
US7299447B2Nov 20, 2007
Method of testing a mapping of an electrical circuit
INFINEON TECHNOLOGIES AG5 citations62
US6877897B2Apr 12, 2005
Method for determining the temperature of a memory cell from transistor threshold voltage
INFINEON TECHNOLOGIES AG4 citations61
US6751140B2Jun 15, 2004
Method for testing integrated semiconductor memory devices
INFINEON TECHNOLOGIES AG2 citations61
US6910163B2Jun 21, 2005
Method and configuration for the output of bit error tables from semiconductor devices
INFINEON TECHNOLOGIES AG2 citations60
US7757064B2Jul 13, 2010
Method and apparatus for sending data from a memory
INFINEON TECHNOLOGIES AG0 citations52
US7437629B2Oct 14, 2008
Method for checking the refresh function of an information memory
INFINEON TECHNOLOGIES AG0 citations52
US7016244B2Mar 21, 2006
Method and arrangement for testing output circuits of high speed semiconductor memory devices
INFINEON TECHNOLOGIES AG0 citations52
US7092300B2Aug 15, 2006
Memory apparatus having a short word line cycle time and method for operating a memory apparatus
INFINEON TECHNOLOGIES AG0 citations41
QIMONDA AG
5 patentsUS7746724B2Jun 29, 2010
Asynchronous data transmission
QIMONDA AG7 citations73
US7957254B2Jun 7, 2011
Concept for reducing crosstalk
QIMONDA AG4 citations62
US7728636B2Jun 1, 2010
Clock signal synchronizing device with inherent duty-cycle correction capability
QIMONDA AG4 citations62
US7865795B2Jan 4, 2011
Methods and apparatuses for generating a random sequence of commands for a semiconductor device
QIMONDA AG1 citations49
US7757132B2Jul 13, 2010
Memory with an output register for test data and process for testing a memory and memory module
QIMONDA AG0 citations42