P

Inventor

SPIRKL WOLFGANG

DE30 patents
⚠️ This page may combine multiple inventors who share the name “SPIRKL WOLFGANG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INFINEON TECHNOLOGIES AG

20 patents
US7439761B2Oct 21, 2008

Apparatus and method for controlling a driver strength

INFINEON TECHNOLOGIES AG15 citations84
US6639862B2Oct 28, 2003

Semiconductor memory with refresh and method for operating the semiconductor memory

INFINEON TECHNOLOGIES AG18 citations84
US6812689B2Nov 2, 2004

Method and device for offset-voltage free voltage measurement and adjustment of a reference voltage source of an integrated semiconductor circuit

INFINEON TECHNOLOGIES AG7 citations73
US6779136B2Aug 17, 2004

Method for testing the refresh device of an information memory

INFINEON TECHNOLOGIES AG10 citations73
US6459649B2Oct 1, 2002

Address generator for generating addresses for an on-chip trim circuit

INFINEON TECHNOLOGIES AG9 citations73
US7649130B2Jan 19, 2010

Integrated circuit

INFINEON TECHNOLOGIES AG3 citations62
US7515456B2Apr 7, 2009

Memory circuit, a dynamic random access memory, a system comprising a memory and a floating point unit and a method for storing digital data

INFINEON TECHNOLOGIES AG4 citations62
US7489153B2Feb 10, 2009

Semiconductor memory device

INFINEON TECHNOLOGIES AG4 citations62
US7398444B2Jul 8, 2008

Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods

INFINEON TECHNOLOGIES AG4 citations62
US7331005B2Feb 12, 2008

Semiconductor circuit device and a system for testing a semiconductor apparatus

INFINEON TECHNOLOGIES AG4 citations62
US7308628B2Dec 11, 2007

Input switching arrangement for a semiconductor circuit and test method for unidirectional input drivers in semiconductor circuits

INFINEON TECHNOLOGIES AG2 citations62
US7307895B2Dec 11, 2007

Self test for the phase angle of the data read clock signal DQS

INFINEON TECHNOLOGIES AG3 citations62
US7299447B2Nov 20, 2007

Method of testing a mapping of an electrical circuit

INFINEON TECHNOLOGIES AG5 citations62
US6877897B2Apr 12, 2005

Method for determining the temperature of a memory cell from transistor threshold voltage

INFINEON TECHNOLOGIES AG4 citations61
US6751140B2Jun 15, 2004

Method for testing integrated semiconductor memory devices

INFINEON TECHNOLOGIES AG2 citations61
US6910163B2Jun 21, 2005

Method and configuration for the output of bit error tables from semiconductor devices

INFINEON TECHNOLOGIES AG2 citations60
US7757064B2Jul 13, 2010

Method and apparatus for sending data from a memory

INFINEON TECHNOLOGIES AG0 citations52
US7437629B2Oct 14, 2008

Method for checking the refresh function of an information memory

INFINEON TECHNOLOGIES AG0 citations52
US7016244B2Mar 21, 2006

Method and arrangement for testing output circuits of high speed semiconductor memory devices

INFINEON TECHNOLOGIES AG0 citations52
US7092300B2Aug 15, 2006

Memory apparatus having a short word line cycle time and method for operating a memory apparatus

INFINEON TECHNOLOGIES AG0 citations41

QIMONDA AG

5 patents

GREGORIUS PETER

2 patents

MICRON TECHNOLOGY INC

2 patents

DORTU JEAN-MARC

1 patent