Inventor
MALIUK DZMITRY S
US4 patents
Patents
4 patentsUS9261561B2Feb 16, 2016
Scan chain latch design that improves testability of integrated circuits
IBM2 citations61
US10571520B2Feb 25, 2020
Scan chain latch design that improves testability of integrated circuits
IBM0 citations50
US9678152B2Jun 13, 2017
Scan chain latch design that improves testability of integrated circuits
IBM0 citations50
US9372231B2Jun 21, 2016
Scan chain latch design that improves testability of integrated circuits
IBM0 citations50