Inventor
IWA YOICHIRO
JP14 patents
⚠️ This page may combine multiple inventors who share the name “IWA YOICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOPCON CORP
12 patentsUS6104481AAug 15, 2000
Surface inspection apparatus
TOPCON CORP113 citations95
US7524062B2Apr 28, 2009
Ophthalmologic apparatus
TOPCON CORP7 citations72
US7533990B2May 19, 2009
Ophthalmologic apparatus
TOPCON CORP4 citations61
US7417732B2Aug 26, 2008
Particle monitoring apparatus and vacuum processing apparatus
TOPCON CORP2 citations61
US7348585B2Mar 25, 2008
Surface inspection apparatus
TOPCON CORP4 citations61
US7245366B2Jul 17, 2007
Surface inspection method and surface inspection apparatus
TOPCON CORP3 citations61
US7154597B2Dec 26, 2006
Method for inspecting surface and apparatus for inspecting it
TOPCON CORP5 citations61
US6771364B2Aug 3, 2004
Surface inspecting apparatus
TOPCON CORP6 citations61
US7477373B2Jan 13, 2009
Surface inspection method and surface inspection device
TOPCON CORP2 citations60
US7227649B2Jun 5, 2007
Surface inspection apparatus
TOPCON CORP2 citations60
US7566129B2Jul 28, 2009
Ophthalmologic apparatus
TOPCON CORP0 citations40
US7394532B2Jul 1, 2008
Surface inspection method and apparatus
TOPCON CORP0 citations38
SAMSUNG ELECTRONICS CO LTD
2 patentsUS12521769B2Jan 13, 2026
Wafer polishing apparatus and method of detecting defect of retainer ring included in the wafer polishing apparatus
SAMSUNG ELECTRONICS CO LTD0 citations43
US10473579B2Nov 12, 2019
Apparatus for inspecting material property of plurality of measurement objects
SAMSUNG ELECTRONICS CO LTD0 citations38