Inventor
ASBAG ASSAF
IL12 patents
Patents
12 patentsUS10832092B2Nov 10, 2020
Method of generating a training set usable for examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD8 citations82
US11138507B2Oct 5, 2021
System, method and computer program product for classifying a multiplicity of items
APPLIED MATERIALS ISRAEL LTD5 citations72
US11199506B2Dec 14, 2021
Generating a training set usable for examination of a semiconductor specimen
APPLIED MATERIALS ISRAEL LTD3 citations71
US10360669B2Jul 23, 2019
System, method and computer program product for generating a training set for a classifier
APPLIED MATERIALS ISRAEL LTD2 citations71
US11526979B2Dec 13, 2022
Method of defect classification and system thereof
APPLIED MATERIALS ISRAEL LTD2 citations70
US10748271B2Aug 18, 2020
Method of defect classification and system thereof
APPLIED MATERIALS ISRAEL LTD4 citations70
US11037286B2Jun 15, 2021
Method of classifying defects in a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD2 citations67
US11568531B2Jan 31, 2023
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD1 citations58
US10803575B2Oct 13, 2020
System, method and computer program product for generating a training set for a classifier
APPLIED MATERIALS ISRAEL LTD0 citations50
US11151706B2Oct 19, 2021
Method of classifying defects in a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD0 citations48
US10921334B2Feb 16, 2021
System, method and computer program product for classifying defects
APPLIED MATERIALS ISRAEL LTD0 citations48
US11321633B2May 3, 2022
Method of classifying defects in a specimen semiconductor examination and system thereof
APPLIED MATERIALS ISRAEL LTD0 citations46