Inventor
ROSENMAN EFRAT
IL7 patents
Patents
7 patentsUS11205119B2Dec 21, 2021
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD11 citations84
US12183066B2Dec 31, 2024
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD1 citations71
US11348001B2May 31, 2022
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD3 citations71
US11010665B2May 18, 2021
Method of deep learning-based examination of a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD3 citations71
US11526979B2Dec 13, 2022
Method of defect classification and system thereof
APPLIED MATERIALS ISRAEL LTD2 citations70
US10748271B2Aug 18, 2020
Method of defect classification and system thereof
APPLIED MATERIALS ISRAEL LTD4 citations70
US7990546B2Aug 2, 2011
High throughput across-wafer-variation mapping
APPLIED MATERIALS ISRAEL LTD6 citations60