Inventor

RYU KWAN-WOO

KR6 patents

⚠️ This page may combine multiple inventors who share the name “RYU KWAN-WOO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

4 patents

US9255789B2Feb 9, 2016

Method for measuring thickness of object

SAMSUNG ELECTRONICS CO LTD3 citations65

US6927077B2Aug 9, 2005

Method and apparatus for measuring contamination of a semiconductor substrate

SAMSUNG ELECTRONICS CO LTD4 citations60

US9417055B2Aug 16, 2016

Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film

SAMSUNG ELECTRONICS CO LTD0 citations48

US7186577B2Mar 6, 2007

Method for monitoring a density profile of impurities

SAMSUNG ELECTRONICS CO LTD0 citations39

SAMSUNG ELECTRIC

1 patent

US6869215B2Mar 22, 2005

Method and apparatus for detecting contaminants in ion-implanted wafer

SAMSUNG ELECTRIC2 citations60

PARK JANG-IK

1 patent

US8551791B2Oct 8, 2013

Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis

PARK JANG-IK1 citations38