Inventor
FORLENZA ORAZIO P
US12 patents
Patents
12 patentsUS6308290B1Oct 23, 2001
Look ahead scan chain diagnostic method
IBM80 citations96
US7908532B2Mar 15, 2011
Automated system and processing for expedient diagnosis of broken shift registers latch chains
IBM22 citations91
US7234090B2Jun 19, 2007
Method and apparatus for selective scan chain diagnostics
IBM25 citations89
US7934134B2Apr 26, 2011
Method and apparatus for performing logic built-in self-testing of an integrated circuit
IBM11 citations83
US7117415B2Oct 3, 2006
Automated BIST test pattern sequence generator software system and method
IBM13 citations83
US7930601B2Apr 19, 2011
AC ABIST diagnostic method, apparatus and program product
IBM11 citations82
US7392449B2Jun 24, 2008
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
IBM7 citations72
US7395470B2Jul 1, 2008
Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain
IBM4 citations61
US9244757B1Jan 26, 2016
Logic-built-in-self-test diagnostic method for root cause identification
IBM0 citations51
US9244756B1Jan 26, 2016
Logic-built-in-self-test diagnostic method for root cause identification
IBM1 citations51
US9274172B2Mar 1, 2016
Selective test pattern processor
IBM0 citations50
US9274173B2Mar 1, 2016
Selective test pattern processor
IBM0 citations50