Inventor

MUI DAVID

US54 patents

⚠️ This page may combine multiple inventors who share the name “MUI DAVID”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MUI DAVID

APPLIED MATERIALS INC

Integrated shallow trench isolation approach

Method for etching a trench having rounded top and bottom corners in a silicon substrate

Etchant gas and a method for etching transistor gates

Method for etching a trench having rounded top corners in a silicon substrate

Method of controlling critical dimension microloading of photoresist trimming process by selective sidewall polymer deposition

Method of providing a shallow trench in a deep-trench device

Method for controlling accuracy and repeatability of an etch process

Method and apparatus for monitoring and controlling wafer fabrication process

Nitride open etch process based on trifluoromethane and sulfur hexafluoride

Integration of silicon etch and chamber cleaning processes

High resist-selectivity etch for silicon trench etch applications

Method and apparatus for etching material layers with high uniformity of a lateral etch rate across a substrate

Method of providing a shallow trench in a deep-trench device

Method and apparatus for controlling a calibration cycle or a metrology tool

Process for depositing a plasma polymerized organosilicon photoresist film

IBM

Method and system for reissuing load requests in a multi-stream prefetch design

Method and apparatus for dynamically managing instruction buffer depths for non-predicted branches

Transfer of data between processors in a multi-processor system

Method and system for bypass prefetch data path

Method and system for error detection in test units utilizing pseudo-random data

Method for choosing device among plurality of devices based on coherncy status of device&#39;s data and if device supports higher-performance transactions

Method and apparatus for transaction tag assignment and maintenance in a distributed symmetric multiprocessor system

Method for completing a plurality of chained list DMA commands that include a fenced list DMA command element

Non-fenced list DMA command mechanism

Non-fenced list DMA command mechanism

Multiplexer methods and apparatus

DMAC translation mechanism

Buffering instructions of a single branch, backwards short loop within a virtual loop buffer

LAM RES AG

Method and apparatus for processing wafer-shaped articles

Method and apparatus for processing wafer-shaped articles

Method and apparatus for processing wafer-shaped articles

Vapor delivery head for preventing stiction of high aspect ratio structures and/or repairing high aspect ratio structures

Gas mixture including hydrogen fluoride, alcohol and an additive for preventing stiction of and/or repairing high aspect ratio structures

ZHU JI

Composition of a cleaning material for particle removal

Method and apparatus for removing contaminants from substrate

Composition and application of a two-phase contaminant removal medium

Apparatus for application of two-phase contaminant removal medium

HALL RONALD

Efficiency of short loop instruction fetch

Retrieving instructions of a single branch, backwards short loop from a local loop buffer or virtual loop buffer

Retrieving instructions of a single branch, backwards short loop from a virtual loop buffer

LAM RES CORP

Method and apparatus for removing contaminants from substrate

Vapor cleaning of substrate surfaces

ASANO SHIGEHIRO

Controlling bandwidth reservations method and apparatus

Controlling bandwidth reservations method and apparatus

KONIGSBURG BRIAN R

Reducing store-hit-loads in an out-of-order processor

TOSHIBA AMERICA ELECTRONIC

Systems and methods for bandwidth shaping

EKANADHAM KATTAMURI

Operating a stack of information in an information handling system

FRANCE TELECOM

Process for depositing and developing a plasma polymerized organosilicon photoresist film

KAWAGUCHI MARK NAOSHI

Method of particle contaminant removal

PENG GRANT

Acoustic assisted single wafer wet clean for semiconductor wafer process

Method for choosing device among plurality of devices based on coherncy status of device's data and if device supports higher-performance transactions