Inventor
STAMP PATRICK
CH3 patents
Patents
3 patentsUS5280334AJan 18, 1994
Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide by RNF method
TOPCON CORP5 citations60
US5349431ASep 20, 1994
Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide
TOPCON CORP2 citations58
US5278628AJan 11, 1994
Apparatus for measuring cross-sectional distribution of refractive index of optical waveguide by RNF method
TOPCON CORP1 citations49