P

Inventor

CHOI HAN-MEI

KR58 patents
⚠️ This page may combine multiple inventors who share the name “CHOI HAN-MEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

36 patents
US9391090B2Jul 12, 2016

Integrated circuit device including polycrystalline semiconductor film and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD164 citations95
US7646056B2Jan 12, 2010

Gate structures of a non-volatile memory device and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD39 citations92
US6599807B2Jul 29, 2003

Method for manufacturing capacitor of semiconductor device having improved leakage current characteristics

SAMSUNG ELECTRONICS CO LTD33 citations92
US9608163B2Mar 28, 2017

Nano-structure semiconductor light emitting device

SAMSUNG ELECTRONICS CO LTD6 citations84
US7517750B2Apr 14, 2009

Flash memory devices having multilayered inter-gate dielectric layers including metal oxide layers and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD10 citations84
US7510931B2Mar 31, 2009

Method of fabricating a nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD11 citations84
US8970039B2Mar 3, 2015

Integrated circuit devices including electrode support structures and methods of fabricating the same

SAMSUNG ELECTRONICS CO LTD9 citations83
US9576969B2Feb 21, 2017

Integrated circuit device including polycrystalline semiconductor film and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD6 citations81
US6992346B2Jan 31, 2006

Integrated circuit devices with metal-insulator-metal capacitors

SAMSUNG ELECTRONICS CO LTD9 citations74
US6849517B2Feb 1, 2005

Methods of forming capacitors including reducing exposed electrodes in semiconductor devices

SAMSUNG ELECTRONICS CO LTD7 citations74
US9842966B2Dec 12, 2017

Nano-structured semiconductor light-emitting element

SAMSUNG ELECTRONICS CO LTD2 citations73
US9110233B2Aug 18, 2015

Semiconductor devices

SAMSUNG ELECTRONICS CO LTD4 citations73
US7201807B2Apr 10, 2007

Method for cleaning a deposition chamber and deposition apparatus for performing in situ cleaning

SAMSUNG ELECTRONICS CO LTD8 citations72
US7425493B2Sep 16, 2008

Methods of forming dielectric structures and capacitors

SAMSUNG ELECTRONICS CO LTD8 citations71
US6989338B2Jan 24, 2006

Method for forming a multi-layered structure of a semiconductor device and methods for forming a capacitor and a gate insulation layer using the multi-layered structure

SAMSUNG ELECTRONICS CO LTD10 citations71
US10153170B2Dec 11, 2018

Method of fabricating semiconductor device

SAMSUNG ELECTRONICS CO LTD2 citations68
US7927950B2Apr 19, 2011

Method of fabricating trap type nonvolatile memory device

SAMSUNG ELECTRONICS CO LTD6 citations63
US7635633B2Dec 22, 2009

Non-volatile memory device and method of manufacturing the same

SAMSUNG ELECTRONICS CO LTD5 citations63
US7402491B2Jul 22, 2008

Methods of manufacturing a semiconductor device including a dielectric layer including zirconium

SAMSUNG ELECTRONICS CO LTD4 citations63
US7279392B2Oct 9, 2007

Thin film structure, capacitor, and methods for forming the same

SAMSUNG ELECTRONICS CO LTD6 citations63
US7217669B2May 15, 2007

Method of forming a metal oxide film

SAMSUNG ELECTRONICS CO LTD4 citations63
US6800570B2Oct 5, 2004

Method of forming a metal oxide film

SAMSUNG ELECTRONICS CO LTD3 citations63
US9316789B2Apr 19, 2016

Semiconductor devices and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD2 citations62
US7135422B2Nov 14, 2006

Methods of forming a multi-layered structure using an atomic layer deposition process and methods of forming a capacitor of an integrated circuit device

SAMSUNG ELECTRONICS CO LTD4 citations62
US8039054B2Oct 18, 2011

Layer deposition methods

SAMSUNG ELECTRONICS CO LTD2 citations60
US8993420B2Mar 31, 2015

Methods of forming epitaxial layers

SAMSUNG ELECTRONICS CO LTD3 citations59
US7888727B2Feb 15, 2011

Semiconductor device and gate structure having a composite dielectric layer and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD0 citations52
US7682906B2Mar 23, 2010

Method of manufacturing a non-volatile memory device

SAMSUNG ELECTRONICS CO LTD0 citations52
US7566608B2Jul 28, 2009

Methods of forming thin layers including zirconium hafnium oxide and methods of forming gate structures, capacitors, and flash memory devices using the same

SAMSUNG ELECTRONICS CO LTD0 citations52
US7560349B2Jul 14, 2009

Semiconductor device and gate structure having a composite dielectric layer and methods of manufacturing the same

SAMSUNG ELECTRONICS CO LTD1 citations52
US7338863B2Mar 4, 2008

Semiconductor memory device and method of manufacturing the semiconductor memory device

SAMSUNG ELECTRONICS CO LTD0 citations52
US6893501B2May 17, 2005

Method for manufacturing a semiconductor device having a capping layer covering a capacitor of the semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations52
US7964462B2Jun 21, 2011

Method of manufacturing semiconductor device

SAMSUNG ELECTRONICS CO LTD0 citations51
US7820514B2Oct 26, 2010

Methods of forming flash memory devices including blocking oxide films

SAMSUNG ELECTRONICS CO LTD0 citations50
US7605067B2Oct 20, 2009

Method of manufacturing non-volatile memory device

SAMSUNG ELECTRONICS CO LTD0 citations50
US6649502B2Nov 18, 2003

Methods of forming multilayer dielectric regions using varied deposition parameters

SAMSUNG ELECTRONICS CO LTD1 citations50

YOO DONG-CHUL

4 patents

YANG JUN-KYU

3 patents

CHAE SOO-DOO

1 patent

KIM HYO-JUNG

1 patent

YOON JUN-HO

1 patent

SON YONG HOON

1 patent

KIM HONG-SUK

1 patent

CHUNG BYUNG-HONG

1 patent

KIM TAE-GON

1 patent

Showing the top 50 of 58 patents by PatentIndex Score.