Inventor
CHOI HAN-MEI
KR58 patents
⚠️ This page may combine multiple inventors who share the name “CHOI HAN-MEI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
36 patentsUS9391090B2Jul 12, 2016
Integrated circuit device including polycrystalline semiconductor film and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD164 citations95
US7646056B2Jan 12, 2010
Gate structures of a non-volatile memory device and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD39 citations92
US6599807B2Jul 29, 2003
Method for manufacturing capacitor of semiconductor device having improved leakage current characteristics
SAMSUNG ELECTRONICS CO LTD33 citations92
US9608163B2Mar 28, 2017
Nano-structure semiconductor light emitting device
SAMSUNG ELECTRONICS CO LTD6 citations84
US7517750B2Apr 14, 2009
Flash memory devices having multilayered inter-gate dielectric layers including metal oxide layers and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD10 citations84
US7510931B2Mar 31, 2009
Method of fabricating a nonvolatile memory device
SAMSUNG ELECTRONICS CO LTD11 citations84
US8970039B2Mar 3, 2015
Integrated circuit devices including electrode support structures and methods of fabricating the same
SAMSUNG ELECTRONICS CO LTD9 citations83
US9576969B2Feb 21, 2017
Integrated circuit device including polycrystalline semiconductor film and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD6 citations81
US6992346B2Jan 31, 2006
Integrated circuit devices with metal-insulator-metal capacitors
SAMSUNG ELECTRONICS CO LTD9 citations74
US6849517B2Feb 1, 2005
Methods of forming capacitors including reducing exposed electrodes in semiconductor devices
SAMSUNG ELECTRONICS CO LTD7 citations74
US9842966B2Dec 12, 2017
Nano-structured semiconductor light-emitting element
SAMSUNG ELECTRONICS CO LTD2 citations73
US9110233B2Aug 18, 2015
Semiconductor devices
SAMSUNG ELECTRONICS CO LTD4 citations73
US7201807B2Apr 10, 2007
Method for cleaning a deposition chamber and deposition apparatus for performing in situ cleaning
SAMSUNG ELECTRONICS CO LTD8 citations72
US7425493B2Sep 16, 2008
Methods of forming dielectric structures and capacitors
SAMSUNG ELECTRONICS CO LTD8 citations71
US6989338B2Jan 24, 2006
Method for forming a multi-layered structure of a semiconductor device and methods for forming a capacitor and a gate insulation layer using the multi-layered structure
SAMSUNG ELECTRONICS CO LTD10 citations71
US10153170B2Dec 11, 2018
Method of fabricating semiconductor device
SAMSUNG ELECTRONICS CO LTD2 citations68
US7927950B2Apr 19, 2011
Method of fabricating trap type nonvolatile memory device
SAMSUNG ELECTRONICS CO LTD6 citations63
US7635633B2Dec 22, 2009
Non-volatile memory device and method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD5 citations63
US7402491B2Jul 22, 2008
Methods of manufacturing a semiconductor device including a dielectric layer including zirconium
SAMSUNG ELECTRONICS CO LTD4 citations63
US7279392B2Oct 9, 2007
Thin film structure, capacitor, and methods for forming the same
SAMSUNG ELECTRONICS CO LTD6 citations63
US7217669B2May 15, 2007
Method of forming a metal oxide film
SAMSUNG ELECTRONICS CO LTD4 citations63
US6800570B2Oct 5, 2004
Method of forming a metal oxide film
SAMSUNG ELECTRONICS CO LTD3 citations63
US9316789B2Apr 19, 2016
Semiconductor devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations62
US7135422B2Nov 14, 2006
Methods of forming a multi-layered structure using an atomic layer deposition process and methods of forming a capacitor of an integrated circuit device
SAMSUNG ELECTRONICS CO LTD4 citations62
US8039054B2Oct 18, 2011
Layer deposition methods
SAMSUNG ELECTRONICS CO LTD2 citations60
US8993420B2Mar 31, 2015
Methods of forming epitaxial layers
SAMSUNG ELECTRONICS CO LTD3 citations59
US7888727B2Feb 15, 2011
Semiconductor device and gate structure having a composite dielectric layer and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7682906B2Mar 23, 2010
Method of manufacturing a non-volatile memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US7566608B2Jul 28, 2009
Methods of forming thin layers including zirconium hafnium oxide and methods of forming gate structures, capacitors, and flash memory devices using the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7560349B2Jul 14, 2009
Semiconductor device and gate structure having a composite dielectric layer and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD1 citations52
US7338863B2Mar 4, 2008
Semiconductor memory device and method of manufacturing the semiconductor memory device
SAMSUNG ELECTRONICS CO LTD0 citations52
US6893501B2May 17, 2005
Method for manufacturing a semiconductor device having a capping layer covering a capacitor of the semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations52
US7964462B2Jun 21, 2011
Method of manufacturing semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations51
US7820514B2Oct 26, 2010
Methods of forming flash memory devices including blocking oxide films
SAMSUNG ELECTRONICS CO LTD0 citations50
US7605067B2Oct 20, 2009
Method of manufacturing non-volatile memory device
SAMSUNG ELECTRONICS CO LTD0 citations50
US6649502B2Nov 18, 2003
Methods of forming multilayer dielectric regions using varied deposition parameters
SAMSUNG ELECTRONICS CO LTD1 citations50
YOO DONG-CHUL
4 patentsUS8735247B2May 27, 2014
Method for fabricating nonvolatile memory device
YOO DONG-CHUL19 citations83
US8426304B2Apr 23, 2013
Methods of manufacturing a vertical type semiconductor device
YOO DONG-CHUL4 citations61
US8294198B2Oct 23, 2012
Semiconductor integrated circuit device and method of fabricating the same
YOO DONG-CHUL0 citations50
US8440527B2May 14, 2013
Memory device and method of fabricating the same
YOO DONG-CHUL0 citations49
YANG JUN-KYU
3 patentsUS8748249B2Jun 10, 2014
Vertical structure non-volatile memory device and method of manufacturing the same
YANG JUN-KYU13 citations83
US8617947B2Dec 31, 2013
Method of manufacturing semiconductor device
YANG JUN-KYU6 citations82
US8497142B2Jul 30, 2013
Methods of forming conductive layer patterns using gas phase cleaning process and methods of manufacturing semiconductor devices
YANG JUN-KYU4 citations61
CHAE SOO-DOO
1 patentKIM HYO-JUNG
1 patentYOON JUN-HO
1 patentSON YONG HOON
1 patentKIM HONG-SUK
1 patentCHUNG BYUNG-HONG
1 patentKIM TAE-GON
1 patentShowing the top 50 of 58 patents by PatentIndex Score.