Inventor

XIN BINJIE

HK2 patents

Patents

2 patents

US6842532B2Jan 11, 2005

Three dimensional measurement, evaluation and grading system for fabric/textile structure/garment appearance

UNIV HONG KONG POLYTECHNIC29 citations88

US6728593B2Apr 27, 2004

System for analysis of fabric surface

UNIV HONG KONG POLYTECHNIC17 citations77