Inventor · disambiguated record
Jae-Woo Nam
Also filed as: NAM JAE W · NAM JAE-WOO
9 granted patents·1 pending application·112 citations·filing 1996–2015
88Inventor score
Top patents by PatentIndex Score
10 records- 0188US8900468B2Methods of forming a patternSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Dec 2, 2014·6 cites·20 claims
- 0287US8986554B2Method of forming patternsSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Mar 24, 2015·11 cites·20 claims
- 0381US9627201B2Methods of forming holes using mask pattern structuresNAM JAE-WOO·Filed 2015·Granted Apr 18, 2017·5 cites·20 claims
- 0477US9704722B2Method of forming fine pattern and method of manufacturing integrated circuit device using the methodPARK JEONG-JU·Filed 2015·Granted Jul 11, 2017·3 cites·20 claims
- 0573US5850148AVertical probe card apparatus with macro-tension module having notched-shaped needle for self-balancing contactFiled 1996·Granted Dec 15, 1998·39 cites·22 claims
- 0666US5863344ACleaning solutions for semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Jan 26, 1999·33 cites·6 claims
- 0760US8946089B2Methods of forming contact holesSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Feb 3, 2015·1 cites·20 claims
- 0840US6466042B1Wafer type probe card with micro tips for testing integrated circuit chipsFiled 1996·Granted Oct 15, 2002·10 cites·16 claims
- 0940US2013288482A1Methods of forming a patternSAMSUNG ELECTRONICS CO LTD·Filed 2012·Application pending·0 cites
- 1033US5876509ACleaning solution for cleaning semiconductor device and cleaning method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Mar 2, 1999·4 cites·8 claims
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